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A Method and Device for On-line Characteristic Measurement of Components Based on Inductive Coupling Principle

A technology of inductive coupling and measurement method, applied in the direction of measuring devices, measuring electrical variables, measuring electricity, etc., can solve problems such as design failure, designer's easy to ignore, and failure to provide device online characteristic information, so as to ensure effectiveness and accuracy , to ensure the effect of accuracy

Active Publication Date: 2019-09-10
BEIJING RACOBIT ELECTRONIC INFORMATION TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the actual situation is that the components of many international manufacturers and almost all domestic manufacturers do not provide the online characteristic information of the device, and there is no relevant measurement method in the industry, which makes it easy for designers to ignore or over-consider the device. online characteristics, eventually leading to design failure or over-design

Method used

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  • A Method and Device for On-line Characteristic Measurement of Components Based on Inductive Coupling Principle
  • A Method and Device for On-line Characteristic Measurement of Components Based on Inductive Coupling Principle
  • A Method and Device for On-line Characteristic Measurement of Components Based on Inductive Coupling Principle

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0059] Example 1. Measurement of DC voltage bias characteristics of multilayer ceramic capacitors

[0060] The device for measuring the DC voltage bias characteristics of multilayer ceramic capacitors such as Figure 8 shown, where C dut For the multilayer ceramic capacitor to be tested; the DC power supply provides different DC voltages for the capacitor, Z vrm is the frequency-domain impedance of the DC power supply; the inductance Ls is used to ensure that the circuit loop of the injected signal is isolated (blocked) from the power supply, and the inductance value is large enough to satisfy:

[0061] Z Cdut Ls +Z VRM (5)

[0062] Here, Z Cdut and Z Ls is the multilayer ceramic capacitor to be tested C dut and the frequency-domain impedance of the inductor Ls.

[0063] Obtain multilayer ceramic capacitor C to be measured according to the measurement method provided by the invention dut The online frequency-domain impedance characteristic curve of the capacitor can ...

Embodiment 2

[0064] Example 2. Inductor DC current bias characteristic measurement

[0065] Inductor DC voltage bias characteristic measurement device such as Figure 9 shown, where L dut Inductance to be tested; DC power supply and load R L Mate to L dut Provide different DC currents, Z vrm is the frequency domain impedance of the DC power supply; the capacitance C 0 It is used to ensure that the circuit loop of the injected signal is isolated from the power supply (bypass), and the capacitance value is large enough to meet:

[0066]

[0067] Here, Z Ldut and Z C0 Inductance L to be tested dut and capacitance C 0 frequency-domain impedance.

[0068] According to the measurement method provided by the present invention, the online frequency-domain impedance characteristic curve of the inductance Ldut to be tested can be obtained, and then the inductance value under different DC current biases can be obtained based on the RLC model fitting of the inductance.

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Abstract

The invention provides an inductive-coupling-principle-based on-line characteristic measuring method and device of a component. On-line characteristic measuring method comprises: two ports (port1 and port2) of a VNA are connected with an injection probe and a pick-up probe by coaxial cables and a port 2 of the VNA is connected with an SMA connector by a coaxial cable; one end of a series-connection wire is connected to an intermediate signal pin of the SMA connector and the other end is connected to a ground pin of the SMA connector; the injection probe, the pick-up probe and the series-connection wire are in inductive coupling to realize S parameter testing of a pre calibration device; the port 3 of the VNA is changed into an open circuit state, the series-connection wire, the injection probe, the pick-up probe are arranged in a to-be-measured component loop; on the basis of inductive coupling of the injection probe, the pick-up probe and the series-connection wire, S parameter testing of a testing device is realized; and then according to the measured S parameters of the pre calibration device and the testing device, fitting is carried out to obtain on-line characteristics of the to-be-measured device. Therefore, measurement is carried out on the premise that the working state of the DUT is not affected.

Description

technical field [0001] The invention belongs to the technical field of electronic measurement, and in particular relates to an on-line characteristic measurement method and a measurement device for components based on the principle of inductive coupling. Background technique [0002] In the design of electronic products, resistors, capacitors, inductors, filters, magnetic beads, etc. are commonly used components, which are often used in circuit matching, filtering, voltage stabilization, isolation and other functions. In actual use, their nominal values ​​are often It is the most important reference for designers. However, due to the particularity of materials and structures, the online characteristics of some devices in actual application scenarios are often very different from the nominal values. For example, the actual capacitance of a multilayer ceramic capacitor (MLCC) under DC voltage bias The value has a large change; the actual inductance value of the inductance has...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00G01R27/02G01R27/26
Inventor 李兴明高加林曾大治
Owner BEIJING RACOBIT ELECTRONIC INFORMATION TECH CO LTD