Substance-fetching plate device used for high-low temperature box

A technology of high and low temperature boxes and insulation boards, applied in the direction of heating or cooling equipment, laboratory appliances, shells or chambers, etc., can solve the problems of changing the test environment, large temperature changes, affecting the test structure, etc., to achieve guaranteed testing The effect of the result

Inactive Publication Date: 2017-12-15
NORTH ELECTRON RES INST ANHUI CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0002] In industries such as electrical engineering, electronics, and instrumentation, it is necessary to carry out adaptability tests on the parts of the product during storage, transportation, and use in high, low, and humid environments to determine the temperature resistance adaptability of the above products to high, low, and humid environments. , especially the changes in the electrical and mechanical properties of the product, it is necessary to use a high and low temperature box during the test. The high and low temperature box can simulate the test conditio

Method used

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  • Substance-fetching plate device used for high-low temperature box

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[0012] In order to make the present invention clearer, the device will be described in detail below in conjunction with the accompanying drawings. The specific embodiments described here are only used to explain the present invention and are not intended to limit the present invention.

[0013] Such as figure 1 As shown, the present invention provides a fetching plate device for a high and low temperature box, including a box body 1. The box door 2 is rotated at the opening of the box body 1, and a transparent partition is connected at the opening of the box body 1. Temperature plate 3, one side of the temperature insulation plate 3 is connected to the box body 1 through two hinges 8, and the other side of the temperature insulation plate 3 is also fixedly connected to the box body 1 through two pin devices. The pin device is relatively fixedly connected The plug 9 on the temperature isolation plate 3 and the buckle groove 10 fixedly connected to the box body 1 are correspondingl...

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Abstract

The invention relates to a substance-fetching plate device used for a high-low temperature box. The substance-fetching plate device comprises a box body (1), wherein the position of the opening of the box body (1) is rotatably connected with a box door (2), and is in fit connection with a heat-insulating plate (3); a seal ring (4) is arranged between the transparent heat-insulating plate (3) and the opening of the box body (1); and the heat-insulating plate (3) is provided with substance-fetching openings (5); each substance-fetching opening is in fit connection with a heat-preserving and heat-insulating soft sheet (6); and each heat-preserving and heat-insulating soft sheet is provided with cutting notches (7) used for fetching a substance. The substance-fetching plate device has the following advantages: during product replacement for the device, the box door is opened, and a product is fetched out and placed from the position of the cutting notches of a heat-preserving and heat-insulating soft sheet, so the testing environment of the interior of the high-low temperature box can be guaranteed from being damaged, and the testing results of the product are effectively guaranteed.

Description

technical field [0001] The invention relates to a test device for electronic products, in particular to a pick-up board device for a high-low temperature box. Background technique [0002] In industries such as electrical engineering, electronics, and instrumentation, it is necessary to carry out adaptability tests on the parts of the product during storage, transportation, and use in high, low, and humid environments to determine the temperature resistance adaptability of the above products to high, low, and humid environments. , especially the changes in the electrical and mechanical properties of the product, it is necessary to use a high and low temperature box during the test. The high and low temperature box can simulate the test conditions of different environments such as high temperature and low temperature. Many products need to be tested under constant temperature conditions. However, the existing high and low temperature boxes have the following disadvantages in ...

Claims

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Application Information

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IPC IPC(8): B01L1/00B01L7/00
CPCB01L1/00B01L7/00
Inventor 刘尊建肖雷尤广为
Owner NORTH ELECTRON RES INST ANHUI CO LTD
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