Flip LED chip testing and sorting device

Abstract

The invention discloses a flip LED chip testing and sorting device. The flip LED chip testing and sorting device is used for testing a flip LED chip. The flip LED chip testing and sorting device comprises a material supply device for supplying members to be tested to the flip LED chip testing and sorting device, a testing unit for testing the member to be tested, a material feeding mechanism and a visual determination direction reversing mechanism. The material feeding mechanism is arranged between the material supplying device and the testing unit and is used for delivering the member to be tested which is supplied by the material supply device to the testing unit; the visual determination reversing mechanism is in butt joint with the material feeding mechanism; the visual determination reversing mechanism collects the direction of the member to be tested and compares the direction of the member to be tested with a preset direction; if the direction of the member to be tested is different from the preset direction, the direction of the member to be tested is adjusted to the preset direction. The flip LED chip testing and sorting device improves an automated degree of the flip LED chip testing and sorting.

Description

technical field [0001] The invention relates to the field of chip testing, in particular to a sorting device for flip-chip testing. Background technique [0002] At present, LED products on the market are getting smaller and smaller, and the pins are getting more and more complicated. To test such ultra-small LED products, traditional testing and sorting equipment requires more complex mechanisms, higher precision, and smaller parts. This not only greatly increases the manufacturing cost and the difficulty of assembly and debugging, but also its stability and production capacity are not ideal. Traditional testing methods are generally difficult to meet the production and quality requirements of such ultra-small LED components. In order to solve the above problems, it is necessary to provide a sorting method for flip-chip testing to meet the testing and sorting requirements of ultra-small LED products. Contents of the invention [0003] In view of this, the present inven...

AI Technical Summary

Problems solved by technology

[0002] At present, LED products on the market are getting smaller and smaller, and the pins are getting more and more complicated

To test such ultra-small LED products, traditional test and sorting equipment requires more complex mechanisms, higher precision, and smaller parts

This not only greatly increases the manufacturing cost and the difficulty of assembly and debugging, but also its stability and production capacity are not ideal.

Traditional testing methods are generally difficult to meet the production and quality requirements of such ultra-small LED components

Images