A wavelength calibration system and method
A wavelength calibration and calibration technology, which is applied in the field of precise spectrum calibration, can solve the problems of increasing wavelength calibration error, calibration error, and large volume of the calibration system, so as to eliminate the influence of calibration accuracy and avoid calibration Calibration error, the effect of a simple calibration system
Active Publication Date: 2019-07-26
SHANGHAI JIAOTONG UNIV
View PDF5 Cites 0 Cited by
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
[0004] In the traditional wavelength calibration method, the calibration method using the characteristic emission spectrum or absorption spectrum, the limited number of spectral lines and the uneven distribution will increase the error of wavelength calibration
Using a monochromator, tunable laser or tunable wavelength element based on a standard spectrometer can improve the error of the aforementioned wavelength calibration, but due to the need for wavelength scanning components, the calibration time will be longer and the calibration system will be larger
The calibration method based on low-coherence interferometry technology gets rid of the dependence on the standard spectrometer, but it needs to build a complex interferometric device, which is not stable enough and the application is not simple and convenient.
[0005] After searching, the Chinese patent publication number is CN104655278A, which proposes a wavelength calibration instrument, which is a wavelength calibration system based on a double-sided metal-clad waveguide and a standard spectrometer. The calibration method is simple and easy, but in In the absence of a standard spectrometer, the wavelength calibration cannot be completed independently. In addition, in the process of collecting the waveguide reflectance spectrum, the measured absorption spectrum is sensitive to the waveguide structure. Once the environment changes, the structural change will easily lead to calibration. error
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View moreImage
Smart Image Click on the blue labels to locate them in the text.
Smart ImageViewing Examples
Examples
Experimental program
Comparison scheme
Effect test
Embodiment Construction
[0036] The present invention will be described in detail below in conjunction with specific embodiments. The following examples will help those skilled in the art to further understand the present invention, but do not limit the present invention in any form. It should be noted that those skilled in the art can make several modifications and improvements without departing from the concept of the present invention. These all belong to the protection scope of the present invention.
[0037] Such as figure 1As shown, it is a schematic structural diagram of an embodiment of the wavelength calibration system of the present invention, which includes: a light source, a first coupling lens, a first optical fiber, a collimating lens, a polarizing element, a prism waveguide, a second coupling lens, a second optical fiber, to be determined Standard spectrometer and computer, wherein: the light emitted by the light source 1 reaches the first coupling lens 2, enters the first optical fib...
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More PUM
Login to View More Abstract
The invention provides a wavelength calibration system and method. The system includes a light source, a first coupling lens, a first optical fiber, a collimating lens, a polarizing element, a prism waveguide, a second coupling lens, a second optical fiber, a to-be-calibrated spectrometer, and a computer. The polarizing element is disposed between the collimating lens and the prism waveguide. The method includes the following steps: S1, calculating the wavelength of each absorption peak of the absorption reflection spectrum of the waveguide at a certain incident angle according to the waveguide material and structure parameters of the prism waveguide and the incident angle of parallel light; S2, carrying out calibration fitting on the pixel position of the actual absorption spectrum peak measured by the to-be-calibrated spectrometer according to the result in S1; and S3, using the spectrum line calibration error of a known standard light source to finely adjust and correct the dielectric layer thickness and incident angle of the waveguide, thus completing calibration. The system and the method can achieve fast and simple calibration, cover any band range, and are especially suitable for spectrometer calibration needing no standard spectrometer.
Description
technical field [0001] The invention relates to a wavelength calibration system and method, which are applied in the field of spectroscopic instrument detection, and are especially suitable for precise spectral calibration lacking standard spectrometers. Background technique [0002] As early as the late 1850s, German chemist Bunsen and physicist Kirchhoff laid the foundation for spectroscopic analysis. Spectrum can be divided into atomic spectrum and molecular spectrum according to radiation mode, can be divided into absorption and scattering spectrum according to transmission mode, and can be divided into ultraviolet, visible and infrared spectrum according to spectral range. Each type of spectrum has a unique excitation mode and application range. Spectral technology has been active in food, medicine, clinical, astronomy, etc. due to its advantages of fast analysis speed, easy operation, good selectivity, high sensitivity and less sample damage. , archaeology, environmen...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More Application Information
Patent Timeline
Login to View More Patent Type & AuthorityPatents(China)
IPC IPC(8): G01J3/28G01M11/02
CPCG01J3/28G01M11/02
Inventor黄梅珍刘希汪洋陈婕孔丽丽徐永浩戎念慈
OwnerSHANGHAI JIAOTONG UNIV