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Raster image processor testing method and device

A raster image and processor technology, applied in image communication, television, electrical components, etc., can solve problems such as long duration, poor test accuracy, and low test efficiency

Active Publication Date: 2019-06-14
PEKING UNIV +2
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The embodiment of the present invention provides a raster image processor testing method and device. The method solves the problem that the existing raster image processor testing methods all use human eyes to test, which makes the entire test process last too long and test efficiency is low. Technical issues that degrade and degrade test accuracy

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  • Raster image processor testing method and device

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Embodiment Construction

[0030] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0031] It should be understood that the term "and / or" used herein is only an association relationship describing associated objects, which means that there may be three relationships, for example, A and / or B, which may mean that A exists alone, and A and B exist simultaneously. B, there are three situations of B alone. In addition, the chara...

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Abstract

The invention provides a test method and device of a grid image processor. The method comprises steps of acquiring a test strategy parameter and a test sample set; using a target grid image processorand a reference grid image processor to correspondingly generate a target image and a reference image of each test sample in the test sample set; calculating a target blocking characteristic vector ofeach target image and a reference blocking characteristic vector of each reference image; comparing the target blocking characteristic vectors and the corresponding reference blocking characteristicvectors; if the target blocking characteristic vectors are different from the corresponding reference blocking characteristic vectors, comparing the target images and the reference images according tothe test strategy parameter; if the target images and the reference images fail to meet the test strategy parameter, calculating difference images of the target images and the reference images; and if the number of the difference images in the test sample set is larger than or equal to a preset threshold, determining that the target grid image processor fails to pass the test. According to the invention, automatic test of the grid image processor is achieved.

Description

technical field [0001] The embodiments of the present invention relate to the technical field of testing, and in particular to a testing method and device for a raster image processor. Background technique [0002] A raster image processor (English: Raster Image Processor, abbreviated as: RIP) is an interpreter, which is used to interpret and convert the layout information described in the page description language into data information that can be output by the output device. RIP is the core software component of the prepress processing system. The output quality, output speed and other performance indicators of a prepress processing system depend on the quality of RIP to a large extent. [0003] In order to ensure the quality of RIP, there are strict quality requirements in the RIP testing process. In the prior art, the testing of RIP products is carried out manually, and the process is as follows: testers submit test samples to the target RIP and benchmark RIP to be test...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04N17/00
Inventor 王剑谢浩朱暄孟张伟
Owner PEKING UNIV