Electric/electronic device board level redundancy testing system
A technology for power electronics and redundant testing, which is applied in the direction of measuring electricity, measuring devices, and measuring electrical variables, etc., can solve the problems of increased testing costs, reduced power electronic equipment development efficiency, frequent updates, etc., to reduce development costs and expand testing type, the effect of improving development efficiency
Pending Publication Date: 2018-01-16
武汉华海通用电气有限公司
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Problems solved by technology
[0004] The update speed of power electronic equipment products is very fast, and there is a problem of frequent update of specific functional board-level test benches, resulting in an increase in test costs; the update process of test benches is limited by hardware resources, and more development costs need to be invested, making the test process. Realize that more resources need to be invested to reduce the efficiency of power electronics equipment development
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[0032] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute a conflict with each other.
[0033] The power electronic equipment board-level redundancy test system provided by the embodiment, its system is as follows: figure 1 As shown, it includes a signal source, a signal conversion board, a power supply, a conditioning board and a general output interface; wherein, the signal source is implemented by a NI (National Instruments, National Instruments) host computer;
[0034] Among t...
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The invention discloses an electric / electronic device board level redundancy testing system. The electric / electronic device board level redundancy testing system comprises a signal source, a signal patch panel, a conditioning plate and a universal output interface. The input terminal of the signal patch panel is connected to a signal source and the output terminal of the signal patch panel is connected to the input terminal of the conditioning plate. The power supply terminal of the conditioning plate is connected to a power supply and the output terminal of the conditioning plate is connectedto the universal output interface. The electric power electronic device board level redundancy testing system can be adapted to testing requirements of various interfaces of circuits, adapted to various testing environments, verifies feasibility of the scheme during a development process in real time, and improves efficiency of testing the electric / electronic device. Moreover, one electric / electronic device board level redundancy testing system can satisfy testing of multiple devices and can reduce cost and space requirements of the testing device.
Description
technical field [0001] The invention belongs to the technical field of power electronic equipment testing, and more specifically relates to a board-level redundancy testing system for power electronic equipment. Background technique [0002] The continuous popularization of power electronic equipment has made the power system put forward higher requirements for power quality and safe and stable operation. The board-level performance of the circuit boards of each device directly affects the performance of the whole machine. need. Existing power electronic equipment has the characteristics of many types, complex interface relationships, and difficult testing, which largely limits its application in various fields. Diversity and safety are issues that must be considered in the testing of power electronic equipment. [0003] For different power electronic equipment, it is equipped with corresponding board-level test benches for specific functional tests. Develop new power elec...
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IPC IPC(8): G01R31/00
Inventor 钟顺时林华章柏澜项新民柳彬曾祥孔皇丰辉黄青梅
Owner 武汉华海通用电气有限公司