Method for measuring thickness of optical component
A technology of optical components and measurement methods, applied in the field of measurement, can solve the problem of low measurement sensitivity, and achieve the effect of good application prospects
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment
[0049] Example: such as figure 1As shown, the present invention provides a device for measuring the thickness of optical components. A wide-spectrum light source 101 (a Gaussian or rectangular wide-spectrum light source can be used) passes through a fiber polarizer 102 and then enters a fiber coupler 103 . One output end of the fiber coupler is connected to the mount 104 of the optical device under test, and the optical component 106 under test is inserted into the mount for measurement during measurement. The other light of the fiber coupler 103 enters an electro-optic modulator 105 , and the output light of the modulator and the output light of the mounting base 104 of the optical device under test are combined through the fiber coupler 107 . The fiber coupler 103, the mount 104 of the optical device to be tested, the electro-optic modulator 105 and the fiber coupler 107 form a Mach-Zehnder interferometer. The two paths of light of the two arms of the interferometer are com...
PUM
Property | Measurement | Unit |
---|---|---|
Bandwidth | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
![application no application](https://static-eureka.patsnap.com/ssr/23.2.0/_nuxt/application.06fe782c.png)
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap