Method for measuring thickness of optical component

A technology of optical components and measurement methods, applied in the field of measurement, can solve the problem of low measurement sensitivity, and achieve the effect of good application prospects

Active Publication Date: 2018-01-26
江西特莱斯光学有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The technical problem to be solved by the present invention is to overcome the defect of low measurement sensitivity of existing thickness measuring devices, and provide a measuring device for the thickness of optical components, thereby solving the above problems

Method used

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  • Method for measuring thickness of optical component
  • Method for measuring thickness of optical component
  • Method for measuring thickness of optical component

Examples

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Embodiment

[0049] Example: such as figure 1As shown, the present invention provides a device for measuring the thickness of optical components. A wide-spectrum light source 101 (a Gaussian or rectangular wide-spectrum light source can be used) passes through a fiber polarizer 102 and then enters a fiber coupler 103 . One output end of the fiber coupler is connected to the mount 104 of the optical device under test, and the optical component 106 under test is inserted into the mount for measurement during measurement. The other light of the fiber coupler 103 enters an electro-optic modulator 105 , and the output light of the modulator and the output light of the mounting base 104 of the optical device under test are combined through the fiber coupler 107 . The fiber coupler 103, the mount 104 of the optical device to be tested, the electro-optic modulator 105 and the fiber coupler 107 form a Mach-Zehnder interferometer. The two paths of light of the two arms of the interferometer are com...

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Abstract

The invention discloses a method for measuring the thickness of an optical component. A device for measuring the thickness of the optical component comprises a wide-spectrum light source, an electro-optical modulator and a calculator, wherein the output end of the wide-spectrum light source is connected with a first optical fiber coupler, one output end of the first optical fiber coupler is connected with an installing seat of an optical component to be measured, output light of the installing seat of the optical component to be measured and output light of the first optical fiber coupler areconverged by a second optical fiber coupler, the first optical fiber coupler, the installing seat of the optical component to be measured and the second optical fiber coupler form a Mach-Zehnder interferometer, the output end of the Mach-Zehnder interferometer is connected with the electro-optical modulator, and a modulated signal output by the electro-optical modulator is incident onto a high-speed photodetector through a dispersion optical fiber. For the invention, the measuring sensitivity can be up to the micron level, so that the prospect is good.

Description

technical field [0001] The invention relates to a measuring method, in particular to a measuring method for the thickness of an optical component. Background technique [0002] Thickness is one of the important parameters of optical components, especially optical components with birefringence characteristics, whose thickness directly determines its application effect in optical wave plate, optical delay, laser measurement, etc. The thickness of optical components is a basic physical quantity that characterizes the optical material properties of a material. This parameter is an important condition for determining the synthesis, manufacture and application of materials in various fields. [0003] At present, the measurement methods for the thickness of optical components mainly include physical measurement method, optical interference method and magnetron sputtering radio frequency method. The invention proposes a method for measuring the thickness of optical components based...

Claims

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Application Information

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IPC IPC(8): G01B11/06
Inventor 卢平
Owner 江西特莱斯光学有限公司
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