Method and device for classifying defects of L0 pictures in AOI detection

A defect classification and picture technology, applied in measurement devices, optical testing flaws/defects, analysis of materials, etc., can solve the problems of time cost and labor cost increase, panel misdetection and misjudgment, etc., to achieve strong practicability, improve The effect of high performance and practicality

Inactive Publication Date: 2018-02-09
WUHAN JINGCE ELECTRONICS GRP CO LTD
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Problems solved by technology

[0004] There are currently two solutions for the brightness defects of the L0 screen: one is to directly ignore the two types of defects, and directly output the two according to a relatively strict standard, but this will lead

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  • Method and device for classifying defects of L0 pictures in AOI detection
  • Method and device for classifying defects of L0 pictures in AOI detection
  • Method and device for classifying defects of L0 pictures in AOI detection

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Embodiment Construction

[0027] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments to facilitate a clear understanding of the present invention, but they do not limit the present invention.

[0028] The reason for the formation of bright foreign objects is that there are foreign objects in the cell that are shining, or the polarizer is scratched (including scratches on the upper side and lower side), in the normal black mode, the areas that were originally opaque have translucence. For light, this defect is inherent, regardless of whether a voltage signal is given or not. The relatively bright spot defect is caused by the short circuit of the circuit under the liquid crystal. If no voltage signal is given, the bright spot will not light up without power on.

[0029] Based on the above principles, the present invention provides a method for classifying L0 screen bright spots and foreign matter bright defects. The basic ...

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Abstract

The invention discloses a method and device for classifying defects of L0 pictures in AOI detection. The method comprises the steps that defect detection is conducted on L0 pictures of a panel to determine all brightness defects; surface dust filtration is conducted on the detected brightness defects; the brightness defects are switched to a detection picture one by one for re-judgment, light transmission at the defect positions of the panel proves foreign matter brightness defects, light non-transmission proves bright point type defects, and the detection picture is a picture only displayingbacklight and having no voltage signal. Foreign matter brightness and bright points can be accurately classified by adding one detection picture to re-judge defects, the method is simple and effective, the practicability is strong, the performance of an AOI detection system is effectively improved, and the method has the advantages of being easy to achieve, low in cost and good in practicability.

Description

technical field [0001] The invention belongs to the technical field of panel defect detection, and in particular relates to a defect classification method, device and computer-readable storage medium of an L0 screen in AOI detection. Background technique [0002] With the development of the LCD panel inspection industry, manufacturers have higher and higher requirements for panel inspection, and have different grade and downgrade specifications for different types of defects. In order to correctly degrade the output of the panel, the AOI (Automatic Optical Inspection) equipment needs to accurately classify the detected defects, and then judge and output the classified defects according to the customer's requirements. [0003] Due to the limitations of AOI detection, the camera can only capture the brightness (color) information of the panel, and some defects, such as L0 screen (black, RGB value is 0 screen) polarizer foreign matter bright defect and L0 screen bright spot def...

Claims

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Application Information

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IPC IPC(8): G01N21/88G02F1/13
CPCG01N21/8851G01N2021/8854G01N2021/8887G02F1/1309
Inventor 张胜森
Owner WUHAN JINGCE ELECTRONICS GRP CO LTD
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