Patents
Literature
Patsnap Copilot is an intelligent assistant for R&D personnel, combined with Patent DNA, to facilitate innovative research.
Patsnap Copilot

264 results about "Statistical algorithm" patented technology

STATISTICAL ALGORITHMS integrates up-to-date theoretical and algorithmic aspects of statistics under one roof. Starting with elementary algorithms on mean, median and mode, it thoroughly discusses variance, covariance, correlation, skewness and kurtosis measures, distance metrics, regression models, and variable selection methods.

Supply chain demand forecasting and planning

Disclosed herein are systems and methods for demand forecasting that enable multiple-scenario comparisons and analyses by letting users create forecasts from multiple history streams (for example, shipments data, point-of-sale data, customer order data, return data, etc.) with various alternative forecast algorithm theories. The multiple model framework of the present invention enables users to compare statistical algorithms paired with various history streams (collectively referred to as “models”) so as to run various simulations and evaluate which model will provide the best forecast for a particular product in a given market. Once the user has decided upon which model it will use, it can publish forecast information provided by that model for use by its organization (such as by a downstream supply planning program). Embodiments of the present invention provide a system and method whereby appropriate demand responses can be dynamically forecasted whenever given events occur, such as when a competitor lowers the price on a particular product (such as for a promotion), or when the user's company is launching new sales and marketing campaigns. Preferred embodiments of the present invention use an automatic tuning feature to assist users in determining optimal parameter settings for a given forecasting algorithm to produce the best possible forecasting model.
Owner:JDA SOFTWARE GROUP

Visual measurement method for volume of irregular object

The invention belongs to a visual measurement method for the volume of an irregular object. According to the method, firstly, a system is demarcated, and the pixel equivalent of the system is obtained; secondly, three cameras are utilized for respectively obtaining original images of an object to be measured in three directions of overlooking, left looking and right looking, and in addition, the maximal peripheral length image coordinate parameter of the object to be measured is obtained through a top view; then, a left view and a right view are subjected to three-dimensional reconstruction based on the gray level, and meanwhile, the maximal length pixel of the top view is used as the basis for cutting the reconstruction range corresponding to the left view and the right view; next, corresponding statistical algorithms are adopted for calculating the volume of a three-dimensional object in a three-dimensional model in an image coordinate; and finally, the practical volume of the object to be measured in a world coordinate system is calculated according to the pixel equivalent. The visual measurement method has the advantages that the image grey value is utilized for the three-dimensional reconstruction of the object in an image coordinate system, the volume of the object is calculated through the pixel value, only the pixel equivalent is demarcated in the method, the calculation speed is high, and the real-time requirement can be met in the precision range.
Owner:SHAANXI UNIV OF SCI & TECH

Solar silicon wafer and battery piece counting method based on image processing

The invention discloses a solar silicon wafer and battery piece counting method based on image processing and belongs to the technical field of image processing. The method comprises the following steps that 101, side images of stacked silicon wafers or stacked battery pieces are preprocessed; 102, a measured object is positioned, and a mask is used for processing and limiting an operation region; 103, the images covered with the mask are replicated and subjected to different kinds of threshold processing respectively to obtain a denoised and binarized image; 104, the obtained denoised and binarized image is subjected to post-processing; 105, differential statistical counting and positioning are conducted to obtain the number of the measured stacked silicon wafers or the measured stacked battery pieces. According to the method, the side images of the stacked silicon wafers or the stacked battery pieces are collected, the binary image highlights gaps and filters out other interference noise, and finally a differential statistical algorithm is adopted to obtain the accurate number. By means of the method, the problem of inaccurate counting due to poor quality of the obtained image and high noise is solved, and the counting accuracy and efficiency are improved.
Owner:ZHENJIANG SYD TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products