Double-bus E-FLASH control circuit with self-testing function
A control circuit, bus-type technology, applied in the direction of electrical digital data processing, instruments, etc., can solve the problems of increased complexity, loss of debug (debugging, inconvenient E-FLASH debugging and fault diagnosis, etc., to achieve flexible use, simple structure, The effect of high reliability
Active Publication Date: 2018-02-23
58TH RES INST OF CETC
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Problems solved by technology
[0003] At present, there is a plan to use the E-FLASH controller, but the configuration of data and timing is not flexible enough. For different types of E-FLASH, the hardware code needs to be modified, which increases the complexity of the design. E-FLASH does not have a self-test function. , virtually loses the debug (debugging) function, which is not convenient for E-FLASH debugging and fault diagnosis
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[0018] The present invention will be further described below in conjunction with specific drawings and embodiments.
[0019] Such as figure 1 and figure 2 Shown: in order to be able to meet the requirement to E-FLASH test and control in SoC, the present invention includes the test module 102 that is used for testing E-FLASH unit 103 and can realize the bus interface module 100 to E-FLASH unit 103 operation , the bus interface module 100 is connected to the control module 101;
[0020] Described bus interface module 100 comprises the AHB bridge 105 that is connected with control module 101 and the configuration register 107 that is connected with control module 101, and described configuration register 107 is connected with IPS bridge 106, and described configuration register 107 is connected with E-FLASH unit 103 ;
[0021] The required operations are performed on the E-FLASH unit 103 through the cooperation of the AHB bridge 105 and the IPS bridge 106 , or the required op...
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The invention relates to a double-bus E-FLASH control circuit with a self-testing function. The control circuit comprises a testing module and a bus interface module, the testing module is used for testing an E-FLASH unit, the E-FLASH unit can be operated by the bus interface module, the bus interface module is connected with a control module and comprises an AHB (advanced high-performance bus) bridge and a configuration register which are connected with the control module, the configuration register is connected with an IPS (intrusion prevention system) bridge and connected with the E-FLASH unit, and the AHB bridge is matched with the IPS bridge, so that needed operation is performed on the E-FLASH unit, or the needed operation is directly performed on the E-FLASH unit by the IPS bridge.The control circuit is simple in structure, flexible to use and high in reliability, and testing and control requirements of an E-FLASH in an SoC (system on a chip) can be met.
Description
technical field [0001] The invention relates to a control circuit, in particular to a dual-bus E-FLASH control circuit with a self-test function, which belongs to the technical field of SoC. Background technique [0002] With the continuous improvement of integrated circuit performance and the rapid development of communication technology, SoC type circuits are becoming more and more common; SoC is the abbreviation of system on chip, which is based on CPU as the core and general and custom IP (intellectual property) , forming a product of software and hardware working together. The flexible configuration of SoC can be realized through software programming, and the embedded FLASH can store programming data. At the same time, E-FLASH stands out for its low cost, high stability and flexible use. An essential part of the SoC system. [0003] At present, there is a plan to use the E-FLASH controller, but the configuration of data and timing is not flexible enough. For different...
Claims
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IPC IPC(8): G06F13/16G06F13/42G06F13/40
CPCG06F13/1668G06F13/4027G06F13/4282
Inventor 桂江华张荣高宁
Owner 58TH RES INST OF CETC