Nine-pin to SFP interface circuit for testing

Abstract

The invention discloses a nine-pin to SFP interface circuit for testing. The circuit comprises a nine-pin interface and an SFP interface electrically connected with the nine-pin interface, wherein twodifferential signal lines for transceiving of the SFP interface are connected with two differential signal lines for transceiving of the nine-pin interface respectively to transmit data signals; an LOS port of the SFP interface is connected to an SD port of the nine-pin interface through a comparator, and the comparator is used for reversing LOS signals; MOD-DEF1, MOD-DEF2 and MOD-DEF0 in the SFPinterface are connected with P2, P3 and P4 of a JP1 interface and connected with an external IIC bus through a connector on a test board to provide IIC channels for testing and debugging. The nine-pin to SFP interface circuit for testing is small and convenient, has the similar size as a nine-pin test interface module and is connected with a nine-pin test board through a pin header, so that all that is required is to add or remove a daughter board when a test platform is changed, secondary wire connection is not required, usage time is shortened, the condition of wrong wire connection can beprevented, and the circuit has the probability of no mistake for fool-proof processing.

Description

technical field [0001] The invention belongs to the technical field of photoelectric testing, and more specifically relates to a nine-pin to SFP interface circuit for testing. Background technique [0002] For the test of the optical mode, there are usually nine-pin module test boards and SFP module test boards. Every time the variety of the object under test is changed, it is necessary to reconnect various wirings, which is time-consuming and laborious, and may be connected incorrectly. And after replacement, the nine-pin test board will also be idle at this time, and cannot be effectively utilized. Contents of the invention [0003] In view of the above defects or improvement needs of the prior art, the present invention provides a nine-pin to SFP interface circuit for testing, the purpose of which is to realize the transfer of the nine-pin interface for testing to the SFP interface, thereby solving the problem of replacing the SFP interface in the prior art. A technic...

AI Technical Summary

Problems solved by technology

Every time you change the type of the object under test, you need to reconnect all kinds of wiring, which is time-consuming and labor-intensive, and may be connected incorrectly

And after the replacement, the nine-pin test board will also be idle at this time, and cannot be effectively used

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