A fast scanning circuit for online ohmic voltage drop precompensation

Abstract

The invention discloses a rapid scanning circuit for online ohm voltage drop pre-compensation. The rapid scanning circuit comprises an alternative current power supply, an electrochemical cell, a first operational amplifier, a second operational amplifier, a third operational amplifier, a first resistor, a second resistor, a third resistor, a fourth resistor, a fifth resistor, a sixth resistor, aseventh resistor, a slide rheostat and a capacitor. The first operational amplifier, the first resistor, the second resistor and the third resistor form a constant potential rectifier, the second operational amplifier, the fourth resistor, the fifth resistor and the sixth resistor form a current / voltage conversion circuit, and the third operational amplifier, the seventh resistor, the slide rheostat and the capacitor form a pre-compensation voltage generation circuit. The rapid scanning circuit has the advantages that oscillation and additional time delay brought by a positive feedback ohm voltage drop compensation technique are removed, and output voltage signals can have more ideal volt-ampere characteristics.

Description

technical field [0001] The invention relates to a fast scanning circuit, in particular to an on-line ohmic voltage drop pre-compensation fast scanning circuit. Background technique [0002] Voltammetry examines the electrochemical properties of the system under study by changing the scanning rate of the electrode potential, and can be used for cyclic scanning to obtain reverse information that cannot be obtained by other electrochemical techniques. It is a commonly used electrochemical technique at present. Voltammetry can conveniently provide the thermodynamic parameters of the redox process of chemical or biochemical species, and can also directly gain insight into the kinetic information of various electrochemical reactions, such as: determining the heterogeneous electron transfer rate constant of the system, investigating the multi-step process of the system Electron transfer process, detecting the production and reaction of reaction intermediates and studying the accomp...

AI Technical Summary

Problems solved by technology

[0006] Whether it is the dual op amp fast scanning circuit proposed in the above-mentioned literature 1 or the single op amp fast scanning circuit proposed in the literature 2, the principle is to use the positive feedback ohmic voltage drop compensation technology to compensate the voltage drop caused by the solution resistance of the electrochemical cell. Eliminate the distortion factors caused by the solution resistance of the electrochemical cell, so as to obtain a better volt-ampere signal, but this type of circuit is precisely because of the positive feedback compensation technology, which also comes with the positive feedback ohmic voltage drop compensation technology itself. Natural technical barriers, i.e. the circuit is highly prone to oscillations and additional time delays

Images