Steganalysis Method for Specific Test Samples
A technology of steganalysis and test samples, which is applied in the field of information hiding, can solve problems such as the decline of steganalysis effect and the mismatch of carrier sources, and achieve the effect of improving accuracy and correlation
Active Publication Date: 2020-03-31
UNIV OF SCI & TECH OF CHINA
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[0004] However, steganalysis has encountered many difficulties in the process of transitioning from the laboratory environment to the real scene, the most prominent of which is the problem of carrier source mismatch (CSM, Cover Source Mismatch). CSM is when the test set does not match the training set. A phenomenon in which the effect of steganalysis is significantly reduced
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[0035] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0036] The present invention aims at the current CSM problem of steganalysis, and considers the application scenario that requires precise steganalysis with a small number of test samples. This scenario requires high detection accuracy, but because the sample size to be tested is small, a high-complexity method can be used. Detection method. The problem of precise steganalysis for a small number of specific test samples comes from the actual needs ...
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The invention discloses a steganalysis method for a specific test sample, comprising: calculating the image steganalysis features of the sample to be tested and all training samples by using the steganalysis feature extraction technology; and based on the calculated image steganalysis features Calculate the feature space distance similarity and feature motion pattern similarity between the sample to be tested and each training sample; combine the feature space distance similarity and feature motion pattern similarity to measure the similarity between the sample to be tested and the corresponding training sample, And select N training samples with the closest similarity to the samples to be tested to train the classifier; use the trained classifier to conduct steganalysis on the samples to be tested, and obtain the steganalysis results. This method can improve the correlation between the training set and the test data, and improve the accuracy of steganalysis.
Description
technical field [0001] The invention relates to the technical field of information hiding, in particular to a steganalysis method for a specific test sample. Background technique [0002] Steganalysis is an analysis technology for steganography. For the carrier to be tested, the steganalysis work is divided into several different levels, mainly divided into: steganographic carrier detection, steganographic algorithm analysis, secret information extraction, steganographic Clear text acquisition and other content. Among them, the steganographic carrier detection aims to detect whether the carrier is embedded with secret information; the steganographic algorithm analysis is to analyze the secret information embedding method and embedding rate of the steganographic carrier on the basis of the previous step; the task of secret information extraction is in the first two steps On the basis of the work, the embedding position of the secret message is determined and the steganograph...
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IPC IPC(8): G06F21/60G06K9/62
CPCG06F21/602G06F18/22
Inventor 张卫明俞能海张逸为冯晓兵
Owner UNIV OF SCI & TECH OF CHINA