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Multiple beam and convergent light illumination crossed-beam imaging

A technology for imaging and irradiating light beams, which is applied in image analysis, image data processing, particle and sedimentation analysis, etc. It can solve problems such as image loss of small particles, extinguishing or shielding light beams, and complexity of detection and measurement

Active Publication Date: 2018-03-16
ARTIUM TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, in these techniques, out-of-focus particles in relatively dense particle field conditions often produce shadows that complicate detection and measurement of shadow images of in-focus particles
Additionally, larger particles in the beam path may extinguish or obscure the beam, resulting in image loss of smaller particles at the sample volume
This image loss leads to unacceptable bias in the sampling statistics

Method used

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  • Multiple beam and convergent light illumination crossed-beam imaging
  • Multiple beam and convergent light illumination crossed-beam imaging
  • Multiple beam and convergent light illumination crossed-beam imaging

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Embodiment Construction

[0034] Methods and apparatus for imaging particles using converged light are described. It should be noted that in this document the term "particles" refers to droplets, bubbles or any other objects. The particles may have spherical shapes, deformed spherical shapes or any other shape. Particles may comprise liquids, solid materials, gas bubbles, or any combination thereof.

[0035] For one embodiment, multiple illumination beams are generated that propagate through the particle field in multiple optical paths. A plurality of illumination beams converge at the measurement body. Shadow images of particles are imaged by measuring the portion of the volume at the focal plane of the digital camera. Use multiple illumination beams to remove shadow images of other particles in the particle field.

[0036] For one embodiment, focused light is used to generate shadow images of particles passing through the portion of the measurement volume at the focal plane of the imaging system....

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Abstract

Methods and apparatuses to image particles are described. A plurality of illuminating light beams propagating on multiple optical paths through a particle field are generated. The plurality of illuminating light beams converge at a measurement volume. A shadow image of a particle passing through a portion of the measurement volume at a focal plane of a digital camera is imaged. Shadow images of other particles in the particle field are removed using the plurality of illuminating light beams.

Description

[0001] government permission [0002] This invention was made with government support under Contract No. NNX14CC65P awarded by the National Aeronautics and Space Administration (NASA). The government has certain rights in the invention. technical field [0003] Embodiments of the present invention relate to particle imaging. More specifically, embodiments of the present invention relate to imaging particles using converged light. Background technique [0004] A very wide range of industrial processes use liquid droplets and solid particles of irregular shapes and sizes. Grinding powders, medical inhalers, and spraying are just a few examples. Industrial processes involving coatings produced by thermal and other sprays often involve the determination of particle parameters (eg, particle size, shape, velocity, and spatial location). The areas where the aircraft is icing involve supercooled water droplets in the presence of ice crystals and ice particles (spherical frozen d...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N15/02
CPCG01N15/0205G01N15/0227G01N2015/03G01N2015/025G06T7/571G01N15/0211G01N15/12G06T7/593G06T7/60
Inventor 威廉·D·巴沙洛格雷戈里·A·佩恩哈利德·易卜拉欣迈克尔·J·菲德利希
Owner ARTIUM TECH
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