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Analysis method and device for diffracted wave migration velocity

A technology of migration velocity and diffracted waves, which is used in measurement devices, seismology, instruments, etc., and can solve the problems of poor accuracy of diffracted wave migration velocity and unfavorable high-precision imaging of diffracted waves.

Active Publication Date: 2018-10-09
CHINA UNIV OF MINING & TECH (BEIJING)
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  • Abstract
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  • Application Information

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Problems solved by technology

[0005] In view of this, the object of the present invention is to provide a kind of analysis method and device of diffracted wave migration velocity, to alleviate in the analysis method of existing diffracted wave migration velocity, because the diffraction wave migration velocity obtained is accurate The technical problems that are not conducive to high-precision imaging of diffracted waves caused by poor performance

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  • Analysis method and device for diffracted wave migration velocity
  • Analysis method and device for diffracted wave migration velocity
  • Analysis method and device for diffracted wave migration velocity

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Embodiment 1

[0064] An analysis method of diffracted wave migration velocity, refer to figure 1 , the method includes:

[0065] S102. Acquiring a diffraction wave common imaging point gather of the region to be processed;

[0066] In the embodiment of the present invention, the area to be processed is an area collected in the wild. The common imaging point is equivalent to subdividing the underground grid, and every preset distance is used as an imaging point, and there are multiple diffracted wave rays passing through the imaging point, and the imaging point is the common imaging point. Generally, the above-mentioned preset distance may be 5 m or 10 m, and the embodiment of the present invention does not specifically limit the above-mentioned preset distance. The preset distance mentioned above is related to construction requirements and geological conditions.

[0067] S104. Perform time difference correction on the common imaging point gather of the diffraction wave to obtain the corr...

Embodiment 2

[0124] An analysis device for diffracted wave migration velocity, refer to Figure 8 , the device consists of:

[0125] An acquisition module 11, configured to acquire a diffraction wave common imaging point gather of the region to be processed;

[0126] The time difference correction module 12 is used for performing time difference correction on the common imaging point gather of the diffraction wave to obtain the corrected common imaging point gather of the diffraction wave;

[0127] The superposition processing module 13 is used to perform superposition processing on the corrected diffraction wave common imaging point gather through the improved waveform superposition method to obtain the energy distribution diagram of the diffraction wave, wherein the energy distribution diagram represents the size of the energy and the target information. Correspondence, target information includes: offset speed, time;

[0128] The determining module 14 is configured to determine the ta...

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Abstract

The invention provides a method and a device for analyzing the migration velocity of diffracted wave. The method includes the following steps: acquiring a diffracted wave common imaging point gather of a to-be-processed area; carrying out move-out correction on the diffracted wave common imaging point gather to get a corrected diffracted wave common imaging point gather; superposing the correcteddiffracted wave common imaging point gather to get an energy distribution map of diffracted wave; and determining a target migration velocity corresponding to the maximum energy according to the energy distribution map of diffracted wave, and taking the target migration velocity as the migration velocity of diffracted wave. According to the method of the invention, the corrected diffracted wave common imaging point gather can be superposed through an improved waveform superposition method, the energy distribution map of diffracted wave obtained is highly focused, the position with maximum energy can be accurately determined, and the migration velocity of diffracted wave obtained is more accurate. In the existing method, the migration velocity of diffracted wave obtained is of low accuracy,which is not conducive to high-precision imaging of diffracted wave. By using the method and the device of the invention, the technical problem is alleviated.

Description

technical field [0001] The invention relates to the technical field of seismic exploration modeling, in particular to an analysis method and device for diffracted wave migration velocity. Background technique [0002] Small-scale non-uniform and discontinuous geological bodies such as faults and collapse columns are closely related to coal, oil and gas and other mineral resources. Accurate identification and positioning of small-scale geological bodies is of great significance to the development of mineral resources. In seismic exploration, when the seismic wave propagates in the underground space, according to the Huygens-Fresnel principle, the secondary element diffraction will be excited. When encountering a large-scale geological body, the element diffraction will interfere with each other to form a reflected wave; when When encountering small-scale geological bodies, diffracted waves are formed. Therefore, diffracted waves are the direct seismic response of small-scale...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01V1/30G01V1/36
CPCG01V1/307G01V1/362G01V2210/52G01V2210/63G01V2210/66
Inventor 林朋彭苏萍赵惊涛崔晓芹杜文凤
Owner CHINA UNIV OF MINING & TECH (BEIJING)