Burn-in test method, device and equipment

Abstract

The invention relates to a burn-in test method, device and equipment. The method comprises steps: when the burn-in test is carried out on an electronic product, during each time period in a first timeperiod group of at least one time period for the burn-in test, one test voltage in a first test voltage group is applied to at least one function area of the electronic product; and during each timeperiod in a second time period group of at least one time period for the burn-in test, one test voltage in a second test voltage group is applied to the at least one function area, wherein the first time period group is before the second time period group in the burn-in test, and the test voltage in the first test voltage group is larger than that in the second test voltage group. According to themethod, the device and the equipment, in a condition of not increasing the risk of thermal runaway happening to the electronic product and ensuring the effects of the burn-in test, the burn-in test time of the electronic product is reduced.

Description

technical field [0001] The invention relates to the field of aging testing, in particular to methods, devices and equipment for aging testing. Background technique [0002] Electronic products, including chips, etc., need to undergo burn-in testing (BI: BurnIn) before leaving the factory to screen out electronic products that will fail early during normal use, and avoid delivering these electronic products that will fail early to customers. . Therefore, aging test is an essential process for electronic products before leaving the factory. [0003] The aging test process of electronic products is as follows: After heating the electronic product to a predetermined temperature, apply voltage and input test data to the electronic product to make it work for a certain period of time to accelerate its aging process, observe whether it fails during the test, if it fails remove it to prevent it from flowing into the hands of customers. [0004] Existing aging test methods usually...

AI Technical Summary

Problems solved by technology

However, since the uniform constant voltage is relatively small, it is necessary to test the electronic products for a longer time to screen out the electronic products that will fail early in normal use, which increases the aging test time. time, causing burn-in testing to become a capacity bottleneck in the production of electronic products

However, if the burn-in test time is forcibly shortened in order to prevent the burn-in test from becoming a bottleneck in the production of electronic products under the condition that the uniform fixed voltage is relatively small, it is possible that some components will fail early during normal use. Electronic products cannot be detected, which will lead to poor aging test results

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