Test system and method for response time
A response time and test system technology, applied in the test field, can solve problems such as low response time accuracy, time consumption, and low test efficiency, and achieve high test efficiency and accurate calculation results
Inactive Publication Date: 2018-05-25
DONGGUAN HUABEL ELECTRONICS TECH
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Problems solved by technology
[0004] The inventors found that there are at least the following problems in the prior art: the prior art also needs to consume a certain amount of time when comparing pictures, and the comparison time of pictures of different sizes is also different, resulting in low accuracy of the calculated response time
Moreover, generally only a single operation test can be performed, and the test efficiency is low
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[0021] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention more clear, various implementation modes of the present invention will be described in detail below in conjunction with the accompanying drawings. However, those of ordinary skill in the art can understand that, in each implementation manner of the present invention, many technical details are provided for readers to better understand the present application. However, even without these technical details and various changes and modifications based on the following implementation modes, the technical solution claimed in this application can also be realized.
[0022] The first embodiment of the present invention relates to a response time test system, which is applied to test the response time of the application items of electronic equipment with a touch screen. Wherein, the electronic device is, for example, a mobile phone, a tablet computer, etc.; the applicatio...
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The invention discloses a test system and method for response time, and relates to the technical field of test. The test system comprises a manipulator, at least one conductive pressure head, a host computer and a bearing platform for bearing electronic equipment; and the host computer controls the conductive pressure head to press application items in a touch display screen via the manipulator, obtains a first time point when the conductive pressure head makes contact with the touch display screen as well as a second time point, when the electronic equipment generates control information after the application item is triggered, from the electronic equipment, and calculates a difference, as response time corresponding to the application item, between the second time point and the first time point. Thus, response time of the application item can be calculated more accurately, multiple application items can be tested continuously, and the test efficiency is high.
Description
technical field [0001] The embodiments of the present invention relate to the technical field of testing, and in particular to a response time testing system and method. Background technique [0002] With the rapid development of electronic devices represented by mobile phones, the functions of electronic devices are constantly increasing, and users have higher and higher requirements for the performance of electronic devices. [0003] In the prior art, the performance test of the electronic device is mainly carried out by means of picture comparison, specifically as follows: touch the application program icon on the electronic device, capture a picture of the electronic device through a high-speed camera, and compare the captured picture of the electronic device with the Compared with the pre-stored target picture, when the captured picture matches the preset target picture, it means that the application program of the electronic device has been opened, and the time between...
Claims
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IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 韩继梁
Owner DONGGUAN HUABEL ELECTRONICS TECH