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Method, device and storage medium for calculating surface incident dose

A calculation method and dose technology, applied in the field of medical measurement, can solve the problems of increasing product design complexity and cost, and achieve the effect of preventing excessive radiation risks and saving costs

Active Publication Date: 2021-10-26
NANOVISION TECHNOLOGY (BEIJING) CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] However, using a sensor to measure the incident dose on the patient's surface must install the sensor in the X-ray path and require AD conversion circuit design, which will significantly increase the complexity and cost of product design

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  • Method, device and storage medium for calculating surface incident dose
  • Method, device and storage medium for calculating surface incident dose
  • Method, device and storage medium for calculating surface incident dose

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Embodiment Construction

[0056] The technical content of the present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0057] Such as figure 1 As shown, the surface incident dose calculation method provided by the present invention includes the following steps: first, set the kV value and mAs value of the high-voltage generator, change the kV value, and obtain the incident dose at N different positions from the focal point of the tube; secondly, According to the incident doses at different positions of N distances from the focal point of the tube, the first fitting curve of N distances from the focal point of the tube and the incident dose is obtained; then, assuming that the mAs value of the high-voltage generator is fixed, the fitting when determining any kV value Coefficient, get the second fitting curve of the distance from the focus position of the tube and the incident dose. Finally, according to the relationship between the mA...

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Abstract

The invention discloses a surface incident dose calculation method, which comprises the following steps: setting the kV value and the milliamp-second value of a high-voltage generator, changing the kV value, and obtaining the incident dose at different positions from the focus of a bulb; The incident dose at different positions of the tube focus is obtained, and N first fitting curves between the tube focus position and the incident dose are obtained; among them, N is a positive integer; assuming that the milliamp-second value of the high-voltage generator is fixed, determine any kilovolt value The second fitting curve between the focal position of the tube and the incident dose is obtained by the fitting coefficient at The third fitting curve between the focal point position of the tube and the incident dose; when performing an image examination, the position of the patient from the focal point of the tube is input into the third fitting curve to obtain the incident dose of X-rays. This method prevents the risk of over-radiation of the incident dose.

Description

technical field [0001] The invention relates to a surface incident dose calculation method, equipment and storage medium, belonging to the technical field of medical measurement. Background technique [0002] X-ray imaging equipment is currently the main equipment used in hospitals to provide medical imaging examinations for patients. The main principle is that different tissue structures produce different X-ray attenuation after X-rays pass through the human body. The ray distribution forms a grayscale distribution image corresponding to the structure of human tissue, so that doctors can observe and diagnose the structure of human tissue through this image. [0003] In the clinical application of X-ray imaging equipment, the control of the patient's surface incident dose is a concern of all parties in recent years, because excessive X-ray radiation will increase the risk of human radiation damage. All countries in the European Union have formulated regulations and standard...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G16H30/00G06F17/17
CPCG06F17/17
Inventor 高建
Owner NANOVISION TECHNOLOGY (BEIJING) CO LTD