Unlock instant, AI-driven research and patent intelligence for your innovation.

RMT test method and device

A test method and a test version technology, applied in the computer field, can solve the problems of low test efficiency and achieve the effect of improving test efficiency

Inactive Publication Date: 2018-07-17
ZHENGZHOU YUNHAI INFORMATION TECH CO LTD
View PDF4 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] An RMT test method and device are provided in the embodiment of the present application to solve the problem of low test efficiency in the prior art

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • RMT test method and device
  • RMT test method and device
  • RMT test method and device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0059] In order to enable those skilled in the art to better understand the technical solutions in the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described The embodiments are only some of the embodiments of the present application, but not all of them. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without creative efforts shall fall within the scope of protection of this application.

[0060] figure 2 A schematic structural diagram of a RMT testing system provided in the embodiment of the present application, such as figure 2 As shown, an RMT test system provided in the embodiment of the present application includes a PC 201, a switch 202, and N servers 203, server 1, server 2, ..., server N. Wherein, the server 203...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The embodiment of the invention discloses a RMT test method and device. The method comprises the steps of: operating a first IP scanning instruction, obtaining IP addresses of N servers, and forming afirst IP address list; according to the first IP address list, sending BIOS refreshing instructions to the N servers, performing batch programming of beta BIOSs for the N servers, wherein the beta BIOSs start a RMT test function; operating a second IP scanning instruction, obtaining IP addresses and MAC addresses of the N servers, and forming a second IP address list and an MAC address list; andaccording to the second IP address list, obtaining RMT test data of the N servers, wherein the RMT test data comprises MAC addresses, and the MAC addresses in the RMT test data are configured to indicate data sources of the RMT test data. According to the technical scheme provided by the embodiment, data exchange between a PC machine and servers is achieved through a switch, test of servers can besupported at the same time, and the RMT test efficiency is improved.

Description

technical field [0001] The present application relates to the field of computer technology, in particular to an RMT testing method and device. Background technique [0002] Memory is the main storage component on the server motherboard and plays an important role in the computer storage hierarchy. Memory stability and reliability, as well as memory and motherboard compatibility are critical to server design. In the process of server design and production, differences in different brands of memory, differences in server motherboard materials, PCB layout and wiring design, etc. are all factors that affect the compatibility between server motherboards and memory. Therefore, RMT (Rank Margin Test) is an essential part of the server R&D process. Its test data can reflect the performance of the memory on the server motherboard to a certain extent. R&D personnel can evaluate the PCB device layout and wiring design of the motherboard based on the test data. , reduce project risk. ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H04L12/26H04L29/12
CPCH04L43/0817H04L43/50H04L61/5007H04L2101/622
Inventor 孔祥源
Owner ZHENGZHOU YUNHAI INFORMATION TECH CO LTD