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Cost-sensitive stacking integrated learning framework based on feature inverse mapping

A cost-sensitive, integrated learning technology, applied in the field of pattern recognition, to achieve the effect of reducing deviation, reducing time complexity, and saving parameter selection time

Inactive Publication Date: 2018-07-20
EAST CHINA UNIV OF SCI & TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Aiming at the fact that existing ensemble algorithms cannot effectively solve the imbalance problem, the present invention proposes a cost-sensitive stack ensemble learning framework based on feature inverse mapping by combining stack integration and cost sensitivity

Method used

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  • Cost-sensitive stacking integrated learning framework based on feature inverse mapping
  • Cost-sensitive stacking integrated learning framework based on feature inverse mapping
  • Cost-sensitive stacking integrated learning framework based on feature inverse mapping

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Embodiment Construction

[0011] Below in conjunction with accompanying drawing and example the present invention will be further introduced: the system designed by the present invention is divided into four modules altogether.

[0012] Part I: Data Acquisition

[0013] The process of data collection is to convert real samples into data, and generate a data set represented by vectors for subsequent modules to process. In this step, the collected samples are divided into training samples and testing samples. The training samples are processed first. A training sample generates a vector Among them, i indicates that the sample is the i-th of the total training samples, and c indicates that the sample belongs to the c-th class. Each element of the vector corresponds to an attribute of the sample, and the dimension d of the vector is the number of attributes of the sample. For the convenience of subsequent calculations, all training samples are combined into a training matrix D, in which each row is a ...

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Abstract

The invention provides a cost-sensitive stacking integrated learning framework based on feature inverse mapping in order to effectively solve the problem of unbalanced classification. Firstly, a random forest, a limit forest, a gradient tree, linear discriminant analysis and logistic regression are simultaneously adopted for training of data sets as basic classifiers; then confidences obtained bycross validation of the basic classifiers are stacked through a stacking integrated learning method to form a new feature set; feature exponential transform of the new feature set is performed, an exponent shown in the description of the optimal average logarithmic loss is selected, and feature inverse mapping of the feature is performed with the exponent shown in the description; and finally, thefeature set after inverse mapping is trained by employing cost-sensitive logistic regression. In test steps, the feature obtained by stacking avoids the operation of inverse mapping. Compared with aconventional unbalanced classification integration method, according to the cost-sensitive stacking integrated learning framework, cost sensitivity and stacking integration are firstly combined so that the generalization performance of the unbalanced classification problem is effectively enhanced, and a model can obtain a stable classification threshold.

Description

technical field [0001] The invention relates to the technical field of pattern recognition, in particular to an integrated model for imbalanced classification problems. Background technique [0002] Pattern recognition is the study of using computers to imitate or realize the recognition ability of humans or other animals in order to complete the task of automatic recognition of research objects. In recent years, pattern recognition technology has been widely used in many important fields such as artificial intelligence, machine learning, computer engineering, robotics, neurobiology, medicine, detective science, archaeology, geological exploration, aerospace science and weapon technology. In the past decade, the imbalance problem has received extensive attention in the field of pattern recognition. Because most of the data obtained in real life is unbalanced, such as medical data, access control data, email data and so on. However, the imbalance problem is a huge challenge...

Claims

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Application Information

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IPC IPC(8): G06K9/62
CPCG06F18/213G06F18/214
Inventor 王喆李冬冬曹辰捷高大启
Owner EAST CHINA UNIV OF SCI & TECH
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