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Parallel test method of system functions

A technology of system function and test method, applied in the direction of function inspection, error detection/correction, detection of faulty computer hardware, etc., can solve the problem of taking a long time, and achieve the effect of shortening time and improving test efficiency

Active Publication Date: 2018-07-27
TIANJIN JINHANG COMP TECH RES INST
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  • Abstract
  • Description
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AI Technical Summary

Problems solved by technology

[0004] In short, traditional test systems generally use one test interface for serial testing, and it takes a long time for more complex tests such as system function testing.

Method used

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Examples

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Embodiment Construction

[0014] Specific examples of the present invention are given below. The specific embodiments are only used to further describe the present invention in detail, and do not limit the protection scope of the claims of the present application.

[0015] The present invention provides a parallel testing method (method for short) of a system function, which is characterized in that the method carries out parallel testing for the self-check of the flight control system, specifically comprising the following steps:

[0016] (1) Decompose and optimize test items to form relatively independent test items: through decomposition and optimization, the self-inspection function of the flight control system is decomposed into four relatively independent test items: instruction system, data memory, program memory and input-output interface For detection, these test items can be run in parallel;

[0017] (2) Interface allocation: Since the test items after decomposing and optimizing are not rela...

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Abstract

The invention discloses a parallel test method of system functions. The parallel test method specifically includes the following steps of (1) decomposing and optimizing test items to form relatively independent test items; (2) allocating interfaces; (3) dynamically adjusting the interfaces; (4) after all the test items are completed, uniformly reporting test results to an upper computer or other testing terminals. According to the method, the two types of interfaces are adopted for a parallel test, and a problem that a next test item in a serial test can be conducted only after a previous testitem is completed is solved. Decomposition and optimization of the test items are conducted according to actual system functions to enable each interface to complete independent tests as many as possible without a synchronization or resource constraint problem, the testing efficiency is improved, and the time demanded for system function tests is shortened.

Description

technical field [0001] The invention belongs to the field of system function test, in particular to a parallel test method of system function. Background technique [0002] For the entire device or product, the test is divided into hardware test, single function test and system function test. The hardware test is mainly aimed at the test of the electrical characteristics and connectivity of the hardware; the single function test is to test a certain functional module to test whether it can meet the requirements; the system function test is to test the function of the entire system of the product to check whether it can meet the requirements. Realizing all the required functions not only involves the testing of all functional modules, but also the testing of the entire application process. The traditional system function test has only one test interface, and the system function test is performed serially. After one test is completed, the next test can be carried out. The sys...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/26G06F11/273
CPCG06F11/26G06F11/2733
Inventor 刘慧婕王可李岩候俊马
Owner TIANJIN JINHANG COMP TECH RES INST
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