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Test circuit, array substrate and light-emitting display device

A technology for testing circuits and luminous displays, applied to static indicators, instruments, etc., can solve the problems of increasing development costs and achieve the effect of saving development costs

Active Publication Date: 2019-08-02
WUHAN CHINA STAR OPTOELECTRONICS SEMICON DISPLAY TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] At the same time, when debugging the EL process, it is necessary to make an EL mask separately, that is, a high-precision metal mask (FMM Mask) and a general metal mask (CMM Mask) to shield the influence of the array substrate, and then measure the EL current output characteristics and debug the EL device structure, which greatly increases the development cost

Method used

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  • Test circuit, array substrate and light-emitting display device
  • Test circuit, array substrate and light-emitting display device
  • Test circuit, array substrate and light-emitting display device

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Embodiment Construction

[0015] The following will clearly and completely describe the technical solutions in the embodiments of the present application with reference to the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of them. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of this application.

[0016] see figure 1 , figure 1 It is a structural schematic diagram of an embodiment of the test circuit of the present application. Such as figure 1 As shown, in this application, the test circuit 10 is set at the output end of the scan drive circuit 20, and is used to test the current output characteristics of the pixel unit 30 when the scan drive circuit 20 does not provide a drive signal to the pixel unit 30, wherein the pixel unit 30 It in...

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Abstract

A test circuit, an array substrate and a light-emitting display device. The test circuit (10) is provided at an output end of a scanning drive circuit (20), and is used to test, when the scanning drive circuit (20) does not provide a driving signal to a pixel unit (30), an output characteristic of the current of the pixel unit (30); the test circuit comprises an enable signal line, a scanning signal turn-on line and a plurality of switching transistors (T), each switching transistor (T) comprising a first end (a), a second end (b) and a third end (c), the first end (a) of each switching transistor (T) being connected to the enable signal line, the second end (b) being connected to the scanning signal turn-on line, and the third end (c) being connected to the pixel unit (30). By means of the method above, the position where a problem affecting light emission of an EL light-emitting device has occurred can be determined and the cost of developing the product is reduced.

Description

technical field [0001] The present application relates to the field of display technology, in particular to a test circuit, an array substrate and a light-emitting display device. Background technique [0002] In an active-matrix organic light emitting diode (AMO), generally divided into an array (Array) substrate and an electroluminescent (EL) substrate, wherein the Array substrate provides a driving circuit, including a gate (Gate) drive circuit, scan drive circuit (Scan GOA), control circuit (EM GOA) and pixel drive circuit. The pixel drive circuit is used to provide the anode (Anode) voltage of the EL pixel, the gate drive is used to provide the pixel voltage, the reset (Vi) drive line is used to provide the Anode reset voltage, and the voltage (Vdd) drive line is used for the pixel drive voltage; The voltage (Vss) is a cathode (Cathode) input voltage of the EL pixel and the like. In panel analysis, in order to distinguish between EL and EL device problems, device char...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G09G3/00
CPCG09G3/006
Inventor 陈彩琴
Owner WUHAN CHINA STAR OPTOELECTRONICS SEMICON DISPLAY TECH CO LTD