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Detecting method and detecting device for inherent defects of membrane-covered module

A defect detection and component technology, which is applied in the directions of measuring devices, optical testing flaws/defects, color/spectral characteristic measurement, etc., can solve the problems of low accuracy of detection methods

Active Publication Date: 2018-09-07
BEIJING LUSTER LIGHTTECH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] This application provides a method and device for detecting inherent defects of membrane modules to solve the problem of low accuracy of existing surface defect detection methods

Method used

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  • Detecting method and detecting device for inherent defects of membrane-covered module
  • Detecting method and detecting device for inherent defects of membrane-covered module
  • Detecting method and detecting device for inherent defects of membrane-covered module

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Embodiment Construction

[0068] The following describes the technical solutions in the embodiments of the present invention clearly and completely with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments in this application, all other embodiments obtained by those of ordinary skill in the art without creative work shall fall within the protection scope of this application.

[0069] See figure 1 , A flow chart of a method for detecting defects in modules with membranes.

[0070] The embodiment of the present application provides a method for detecting self-defects of a membrane-equipped module, and the method includes:

[0071] S100. Acquire a reference characteristic spectrum, where the reference characteristic spectrum includes: a first characteristic spectrum with an ideal protective film component and a second characteri...

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Abstract

The invention provides a detecting method and a detecting device for inherent defects of a membrane-covered module. The method comprises the following steps: acquiring a reference characteristic spectrum, wherein the reference characteristic spectrum comprises a first characteristic spectrum of an ideal protection membrane-covered module and a second characteristic spectrum with a dirt module; acquiring a first image of a to-be-detected membrane-covered module according to the first characteristic spectrum; acquiring a second image of the to-be-detected membrane-covered module according to thesecond characteristic spectrum; comparing the first image with the second image, and judging whether the to-be-detected membrane-covered module has the inherent defects or not. According to the detecting method provided by the invention, the problem of low accuracy rate of an existing detecting method for surface defects can be effectively solved.

Description

Technical field [0001] The present application relates to the field of component defect detection of electronic products, and in particular to a method and device for detecting self-defects of a membrane component. Background technique [0002] In the manufacturing process of electronic consumer product components, such as LCD screens, batteries, sound films, cameras, etc., due to poor workmanship, insufficient environmental cleanliness, handling collisions, etc., the surface of electronic product components will be scratched, stained, Defects such as chipping. The production and use of electronic consumer products require very high cleanliness of the component surface. Therefore, in order to ensure the cleanliness of the component surface, cleaning and attaching a protective film are the most commonly used methods. The surface quality of electronic product components is usually performed after cleaning and filming. Therefore, accurate detection of surface defects of electronic ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/25G01N21/88
CPCG01N21/25G01N21/8851G01N2021/8887
Inventor 崔存星姚毅
Owner BEIJING LUSTER LIGHTTECH