Test structure and method for PCB back-drill alignment
A technology of testing structure and testing method, applied in the field of PCB manufacturing, can solve the problems of difficult observation, misjudgment, and time-consuming, and achieve the effect of avoiding waste
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Embodiment 1
[0038] This embodiment provides a test structure for the alignment of PCB back-drilling, which is suitable for PCBs that require back-drilling. drill position.
[0039] figure 1 It is a schematic diagram of the test structure of the PCB back-drilling alignment provided in this embodiment. like figure 1 As shown, the test structure 5 includes: a plurality of test units 6, the test unit 6 is composed of a drill hole 1 and a plurality of reference holes 2, and the drill hole 1 can be back-drilled to obtain a back-drilled hole 3.
[0040] In one said test unit 6, a plurality of said reference holes 2 are arranged around said one borehole 1, and may be arranged in different directions around a borehole 1, said one borehole 1 is connected with each said reference hole 1. The distance between the centers of the holes 2 is equal, and when the center of the back-drilled hole 3 coincides with the center of a drilled hole 1, the minimum distance from the wall of the back-drilled hole ...
Embodiment 2
[0045] This embodiment adopts the test structure provided in the above embodiment, and before back-drilling on the circuit pattern, back-drilling is performed on the test structure to check the alignment of the back-drilling.
[0046] figure 2 It is a flow chart of the method for testing the alignment of PCB back-drilling provided by Embodiment 2 of the present invention. like figure 2 As shown, the test method includes the following steps:
[0047] S11, setting a test structure on the PCB.
[0048] Figure 4 It is a schematic diagram of the position of the test structure on the PCB in the second embodiment of the present invention. combine Figure 4 For illustration, a test structure 5 is respectively arranged around the circuit pattern unit 4 as a group of test structures. As a preferred implementation manner, a test structure 5 is respectively provided at the four corners of the line graphic unit 4 .
[0049] At least one set of test structures are respectively pro...
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