Photovoltaic cable aging resistance test device

A technology for photovoltaic cables and test devices, which is used in measurement devices, weather resistance/light resistance/corrosion resistance, and electrical measurement, etc., can solve problems such as poor practicability, and achieve the effect of strong practicability and avoiding economy and resources.

Inactive Publication Date: 2018-10-12
芜湖特种电线电缆产品质量监督检验中心
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] Aiming at the deficiencies of the prior art, the present invention provides an aging test device for photovoltaic cables, which avoids waste of economy and resources to a certain extent, and solves the problem of poor practicability

Method used

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  • Photovoltaic cable aging resistance test device
  • Photovoltaic cable aging resistance test device
  • Photovoltaic cable aging resistance test device

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Embodiment Construction

[0018] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0019] Such as Figure 1-3 As shown, the present invention provides a technical solution: an aging resistance test device for photovoltaic cables, including a door body 3, a box body 5, a temperature sensor 7, a timing display 11, a heater 15 and a ventilator 17, and the box body 5 A door body 3 is installed at the left end of the door body 3, a handle 1 and an observation window 4 are arranged on the door body 3, and a fixing screw 2 is installed on the handl...

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Abstract

The invention discloses a photovoltaic cable aging resistance test device comprising a door body, a box body, a temperature sensor, a timing displayer, a heater and a ventilator. The left end of the box body is provided with the door body. The door body is provided with a handle, and the front surface of the box body is provided with a temperature control display screen. A heater switch and a lighting switch are arranged on the lower part of the temperature control display screen, and the timing displayer is installed on the lower part of the heater switch. The timing switch is arranged on thelower part of the displayer, and a ventilation rate adjusting knob is arranged on the lower part of the timing switch. The right side surface of the box body is provided with a ventilation pipe and apower plug. The upper surface of the internal part of the box body is provided with a lamp tube, and the right side surface of the internal part of the box body is provided with the temperature sensor and the ventilator. The box body, the temperature sensor, the timing displayer, the ventilation rate adjusting knob and the ventilator are arranged so that the economic and resource waste can be avoided to a certain extent and the problem of low practicability can be solved.

Description

technical field [0001] The invention relates to the technical field of aging detection, in particular to an aging resistance test device for photovoltaic cables. Background technique [0002] The reasons for aging include cable overload heating, sunshine (ultraviolet rays), ambient temperature change range, cable heat dissipation conditions, and exposure to atmospheric and environmental chemical substances, etc., which will cause the insulation and outer sheath of the cable to age, and the severe overload of the cable is to accelerate the cable. The most important reason for insulation aging is that there is information that the long-term overload working temperature of the cable exceeds the allowable long-term working temperature of the insulation by 10°, and the insulation service life of the cable will be reduced by half. Aging will cause short-circuit cable insulation aging, and the dielectric strength will decrease. The breakdown leads to the path of the cable, and now ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/12G01N17/00
CPCG01N17/00G01R31/1272
Inventor 朱萃王显儒王蒙蒙刘元宝
Owner 芜湖特种电线电缆产品质量监督检验中心
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