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Instrument test probe with improved structure

A technology for instrumentation and test probes, which is applied in the field of electronic connectors, can solve problems such as unreasonable design and inconvenient replacement of probes, and achieve the effects of simple structure, quick replacement, and high measurement accuracy

Inactive Publication Date: 2018-10-16
成都博众鼎立科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In order to solve the above technical problems, the present invention provides an instrument test probe with an improved structure to solve the problems of inconvenient replacement and unreasonable design of existing probes

Method used

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  • Instrument test probe with improved structure
  • Instrument test probe with improved structure
  • Instrument test probe with improved structure

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Embodiment

[0021] as attached figure 1 to attach Figure 4 shown

[0022] The present invention provides an instrument test probe with an improved structure, including a needle cover 1, a socket 2, a front needle bar 3, a switch 4, a rear needle bar 5 and a probe assembly 6, and the socket 2 is arranged on the needle cover 1 The rear end of the cavity; the rear needle bar 5 is welded and arranged at the rear end of the socket 2; the front needle bar 3 is arranged at the front end of the cavity of the needle sheath 1; the middle position of the needle sheath 1 is provided with Switch 4; the front end of the needle cover 1 is provided with a probe assembly 6; the probe assembly 6 includes a probe 61, an insulating sleeve 62 and an external thread 63, and an insulating sleeve is provided outside the probe 61 Tube 62 ; the rear end of the probe 61 is provided with an external thread 63 .

[0023] Described switch 4 comprises button 41, spring 42, connecting rod 43 and guide rod 44, and de...

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Abstract

The invention provides an instrument test probe with an improved structure. The instrument test probe comprises a needle sleeve, an inserting opening, a front needle rod, a switch, a rear needle rod and a probe assembly, wherein the inserting opening is arranged at the rear end of a cavity of the needle sleeve; the rear needle rod is arranged at the rear end of the inserting opening in a welding mode; the front needle rod is arranged at the front end of the cavity of the needle sleeve; the switch is arranged in the middle of the needle sleeve; the probe assembly is movably arranged at the front end of the needle sleeve; and the probe assembly comprises a probe, an insulating sleeve and an external thread. The insulating sleeve is arranged outside the probe, and an external thread is arranged at the rear end of the probe. The instrument test probe has the advantages that the structure is simple, the probe assembly can be quickly replaced, and the instrument with high precision requirement can be effectively tested. The instrument test probe is small, convenient to use, high in measurement accuracy, simple to operate and the like, and can effectively protect an instrument.

Description

technical field [0001] The invention relates to the technical field of electronic connectors, in particular to an instrument test probe with an improved structure. Background technique [0002] At present, with the continuous development of science and technology, people have produced more and more sophisticated instruments and meters, so the requirements for the testing of these very precise instruments and meters are also getting higher and higher. The test probes used The requirements are different, but the test probes equipped with the original instruments and meters will no longer meet the requirements, so people have to buy multiple probes of different models to meet the requirements, not only wasting time and money to replace the probes; The existing probe design is unreasonable, short-circuiting is easy to occur during testing and measurement, the technical requirements for personnel are high, and precision instruments and equipment cannot be protected. [0003] The...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R1/067
CPCG01R1/06716
Inventor 金刚
Owner 成都博众鼎立科技有限公司
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