Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Patent information management and analysis system

A technology of patent information and analysis system, which is applied in the field of patent information management and analysis system, can solve problems such as inability to retrieve and analyze patent information, inability to compare and evaluate patent information, and inability to realize classified management of patent information, so as to facilitate classification management and improve retrieval efficiency. The effect of precision and recall

Inactive Publication Date: 2018-11-06
NANJING UNIV OF TECH
View PDF9 Cites 9 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The defect of this patent is that it can only carry out comparative analysis of applicants, and cannot realize the function that users can directly obtain their own patent information and patent analysis reports after login authentication, and cannot realize the management of users' own patents
The defect of this patent is that it can only search and analyze patents, and cannot compare and evaluate the patent information of applicants from multiple institutions, nor can it realize that users can directly obtain their own patent information, patent analysis reports and analyze their own patents after login authentication. Functions for category management
The defect of this patent is that it can only acquire and manage user patent information, but cannot realize functions such as patent analysis and patent comparative evaluation.
The defect of this patent is that the comparative evaluation and overall ranking of applicants’ patent information of multiple institutions can only be performed in the form of scoring, and it is impossible to realize the visual comparative map display of applicants’ patent information on a certain indicator
It is not possible to realize the function that users can directly obtain their own patent information, patent analysis report and classify their own patents after login authentication
Can only search and collect institutional applicant information, and cannot search and analyze patent information according to user instructions

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Patent information management and analysis system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0036] The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0037] like figure 1 As shown, a patent information management and analysis system includes a client platform, an application server, a database server and a file management server. The client platform is connected to the application server and the file server respectively, and the application server is connected to the database server and the file server respectively. The database server is connected with the file server, and the database server is connected with the Internet website through the network.

[0038] The client platform includes login module, authentication module and operation module;

[0039] The login module is used for users to enter the system platform;

[0040] The authentication module includes a user unified identity authentication system. The system sets a unique identification number for the user, and associates the...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a patent information management and analysis system, which comprises a client side platform, an application server and a database server, wherein the client side platform and the application server are in signal interaction; the application server and the database server are in signal interaction; the database server and the Internet are connected; the client side platformcomprises a login module, an authentication module and an operation module; and the application server comprises a patent management module and a patent analysis module. By use of the system, after auser carries out login and authentication, own patent information and the function of a patent analysis report can be directly obtained, and the user can manage the own patent.

Description

technical field [0001] The invention relates to the technical field of information management and analysis, in particular to a patent information management and analysis system. Background technique [0002] In the era of knowledge economy, patents, as an important index to measure the ability of scientific and technological innovation, have attracted more and more attention from institutions such as universities, scientific research institutes and high-tech enterprises. With the continuous increase in the number of patent applications and authorizations by various institutions, the content of patent information has become larger and larger, and the requirements for the management and analysis of patent information have become higher and higher. There is an urgent need for an intelligent patent management software that can not only automatically manage and analyze the user's own patents, but also select and compare target institutions and comparative evaluation indicators ac...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06F17/30G06Q50/18
CPCG06Q50/184
Inventor 赵乃瑄鲍志彦
Owner NANJING UNIV OF TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products