A Method of Improving the Testing Safety of High Power Semiconductor Amplifier

A semiconductor and high-power technology, which is applied in the field of improving the safety of high-power semiconductor amplifier device testing, can solve the problems of burning instruments, not connecting band-stop filters, etc., and achieve the effect of ensuring safety

Active Publication Date: 2021-04-13
CHINA ELECTRONIS TECH INSTR CO LTD
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

[0011] In order to solve the above-mentioned technical problems, the present invention proposes a method for improving the test safety of high-power semiconductor amplifiers, which solves the problem that during the noise power density test, it is very likely that the band-stop filter is not connected or an inappropriate one is connected during the test due to negligence. Band-stop filter, and the problem of burning the instrument occurs

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  • A Method of Improving the Testing Safety of High Power Semiconductor Amplifier

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[0028] It should be pointed out that the following detailed description is exemplary and intended to provide further explanation to the present application. Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs.

[0029] It should be noted that the terminology used here is only for describing specific implementations, and is not intended to limit the exemplary implementations according to the present application. As used herein, unless the context clearly dictates otherwise, the singular is intended to include the plural, and it should also be understood that when the terms "comprising" and / or "comprising" are used in this specification, they mean There are features, steps, operations, means, components and / or combinations thereof.

[0030] As introduced in the background technology, when using the traditional test method, it is very likely tha...

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Abstract

A method for improving the test safety of a high-power semiconductor amplifier, comprising the following steps when performing a noise power density test: Step 1: Input a safe input power P at the input port of the high-power semiconductor amplifier IN‑safe ; Step 2: Detect the output power value P of the high-power semiconductor amplifier OUT , if it is greater than the upper limit, the output port of the high-power semiconductor amplifier is not connected with a suitable band-stop filter or is not connected with a band-stop filter. In the process of testing high-power semiconductor amplifiers, it not only realizes the testing of performance indicators, but also avoids burning out expensive testing instruments such as vector network analyzers and spectrum analyzers.

Description

technical field [0001] The invention relates to the technical field of electronic device testing, in particular to a method for improving the testing safety of high-power semiconductor amplifier devices. Background technique [0002] High-power semiconductor amplifiers are mainly used for power amplification of radio frequency microwave signals, and require good linearity indicators and high output power, so they are widely used. The main indicators for evaluating the performance of high-power semiconductor amplifiers are output power, parasitic modulation, gain, AM / PM variation coefficient, phase shift, group delay, noise figure, standing wave ratio, harmonics, power back-off, and noise power density etc. The required test instruments include vector network analyzers, power meters, spectrum analyzers, noise meters and noise sources. [0003] Taking the test of a high-power semiconductor amplifier with two-input and two-output channels as an example, according to the requir...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R1/36G01R1/28G01R29/26
CPCG01R1/28G01R1/36G01R29/26
Inventor 丁志钊单梅林吴家亮
Owner CHINA ELECTRONIS TECH INSTR CO LTD
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