Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Image super-resolution reconstruction method based on multi-band deep convolutional neural network

A deep convolution, neural network technology, applied in the image field, can solve the problems of gradient disappearance, high training difficulty, low flexibility, etc., to achieve the effect of enhancing image details, good reconstruction results, and fewer convolution layers

Active Publication Date: 2018-11-13
XIDIAN UNIV
View PDF4 Cites 18 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The existing image super-resolution reconstruction methods based on convolutional neural networks can effectively improve the performance of image super-resolution reconstruction, but they have the following defects: these methods use the low-frequency information of the image to reconstruct high-frequency information, and the computational complexity is high. The recovery of image details is still not enough, and the edge and texture details of the reconstructed image are not clear enough to meet the needs of reality.
Moreover, due to the network structure, the training is difficult, it is difficult to achieve convergence, the phenomenon of gradient disappearance is prone to occur, and the flexibility is low.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Image super-resolution reconstruction method based on multi-band deep convolutional neural network
  • Image super-resolution reconstruction method based on multi-band deep convolutional neural network
  • Image super-resolution reconstruction method based on multi-band deep convolutional neural network

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0039] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the present invention will be described more completely below in conjunction with the accompanying drawings and specific embodiments. Herein, the schematic embodiments and descriptions of the present invention are used to explain the present invention, but not as a limitation to the present invention. Based on the embodiments of the present invention, those skilled in the art obtained without creative work All other embodiments belong to the protection scope of the present invention.

[0040] figure 1 A network model of an image super-resolution reconstruction method based on a multi-band deep convolutional neural network provided by the present invention, figure 2 It is the network model training flowchart of the present invention, image 3 For the reconstruction flow chart of processing the low-resolution image to be tested in the present invention,...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an image super-resolution reconstruction method based on a multi-band deep convolutional neural network, comprising the following steps: selecting training samples and test samples; inputting training images to the network in batches for feature extraction, and combining long-term and short-term memories to construct a multi-band learning structure, then performing featurerefinement, feature mapping and up-sampling reconstruction; and obtaining network parameters according to the model obtained through training to complete the image reconstruction. The invention enhances high-frequency information reconstruction by introducing multi-band learning, and uses the memory migration operation to make the network have long-term and short-term memories at the same time, which speeds up the image reconstruction speed, enhances image edge and texture detail reconstruction, and obtains image super-resolution reconstruction results of better quality. The invention has strong super-resolution capability, and the reconstructed image is closer to the real image.

Description

technical field [0001] The invention belongs to the field of image technology, and in particular relates to a method for super-resolution reconstruction of a single image based on a multi-band deep convolutional neural network. Background technique [0002] In fields such as medicine, astronomy, monitoring, and military affairs, high-resolution images are of great significance. However, the current traditional image super-resolution technology cannot reconstruct better high-resolution images, and the restoration of texture details and edge features needs to be improved. In recent years, image super-resolution reconstruction methods based on convolutional neural networks have more advantages than traditional methods and have received extensive attention. [0003] Dong et al. first proposed a convolutional neural network-based image super-resolution reconstruction method SRCNN, which greatly improved image resolution by using a three-layer convolutional neural network. Then t...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06T3/40G06N3/08
CPCG06N3/084G06T3/4007G06T3/4053
Inventor 程培涛高静张大兴章云
Owner XIDIAN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products