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Simple method for evaluating heat resistance of wheat

An evaluation method and technology of heat resistance, applied in thermal analysis of materials, measuring devices, instruments, etc., can solve the problems of ignoring yield, not uniformly evaluating the heat resistance index of wheat, and only focusing on heat resistance

Inactive Publication Date: 2018-11-30
CROP RES INST SHANDONG ACAD OF AGRI SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, many researchers only pay attention to heat tolerance while ignoring yield when screening and evaluating wheat heat tolerance, or because the test method is limited to laboratory measurement, etc., there is no unified, simple and easy evaluation index of wheat heat tolerance method

Method used

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  • Simple method for evaluating heat resistance of wheat
  • Simple method for evaluating heat resistance of wheat
  • Simple method for evaluating heat resistance of wheat

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Embodiment 1

[0022] No.1. Materials and methods

[0023] No.1.1 Experimental design

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Abstract

The invention discloses a simple method for evaluating the heat resistance of wheat. The method comprises the steps of carrying out field planting, building a shed for performing high temperature treatment, observing and recording plant morphology, determining a normalized difference vegetation index, evaluating heat resistance, and the like. After the high temperature treatment is finished, if the decrease of the normalized difference vegetation index is significant, the heat resistance is proved to be poor; after the high temperature treatment is finished, if the decrease of the normalized difference vegetation index is not significant, the heat resistance is proved to be good. The method utilizes the normalized difference vegetation index as a heat resistance index, and provides a theoretical basis for a wheat stress-resistant and stable-yield cultivation technique and wheat variety breeding.

Description

technical field [0001] The invention relates to the field of stress resistance physiology of wheat, in particular to a simple evaluation method for heat tolerance of wheat. Background technique [0002] Wheat is the food crop with the widest distribution range, the largest planting area and the highest total output in the world. Wheat is also the third largest grain crop in my country, and its yield directly affects people's living standards and national food security. During the 250-day growth period of wheat, abiotic stress is the main reason for the reduction of wheat yield, among which high temperature stress, especially the high temperature in the late growth period, seriously affects the yield and quality of wheat. Wheat often encounters high temperatures above 32°C after flowering, which is a critical period for the formation of wheat yield and quality. High temperature stress decreased photosynthetic capacity of wheat, accelerated plant aging, shortened grain filli...

Claims

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Application Information

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IPC IPC(8): G01N25/00A01G22/20
CPCA01G22/20G01N25/00
Inventor 冯波王法宏孔令安王宗帅李华伟李升东张宾
Owner CROP RES INST SHANDONG ACAD OF AGRI SCI
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