IGBT aging test circuit and method

A technology of aging test and current test, applied in bipolar transistor test, single semiconductor device test and other directions, can solve the problem of uninvolved aging state of high-power switching devices, and achieve the effect of ensuring safe operation

Pending Publication Date: 2018-11-30
BEIJING JIAOTONG UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] In order to ensure the safe operation of trains, online evaluation and prediction of the service life of high-power switching devices is required. However, the monitoring and life prediction of the aging status of high-power switching devices in traction converters have not been involved in the industry at present.

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  • IGBT aging test circuit and method
  • IGBT aging test circuit and method

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Embodiment Construction

[0043] In order to make the purposes, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be described clearly and completely below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments It is a part of the embodiments of the present application, but not all of the embodiments. The components of the embodiments of the present application generally described and illustrated in the drawings herein may be arranged and designed in a variety of different configurations.

[0044] Thus, the following detailed description of the embodiments of the application provided in the accompanying drawings is not intended to limit the scope of the application as claimed, but is merely representative of selected embodiments of the application. Based on the embodiments in the present application, all other embodiments obtained...

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Abstract

The invention relates to an IGBT aging test circuit and method. The circuit comprises a first current source, a second current source, a forward and reverse flow guiding unit and a unit to be tested;the first current source provides an aging test current for the unit to be tested through the forward and reverse flow guiding unit; the forward and reverse flow guiding unit is used for adjusting thedirection of the aging test current flowing through the unit to be tested, so as to simulate the IGBT working state by the direction of the aging test current flowing through the unit to be tested; and the second current source provides a junction temperature test current for the unit to be tested, so as to test a saturation voltage of the unit to be tested under the junction temperature test current, and aging test is carried out on an IGBT through the saturation voltage. According to the IGBT aging test circuit provided by the invention, the aging test of the IGBT is completed by the agingtest circuit, and the service life of the IGBT is evaluated and predicted online, which can effectively monitor the working state of the IGBT, replace the IGBT that is about to be damaged in advance,and ensure the safe operation of a railway train.

Description

technical field [0001] The present application relates to the field of power switching device testing, and in particular, to an IGBT aging test circuit and method. Background technique [0002] As an important mode of public transportation in large and medium-sized cities, rail transit system is increasingly widely used due to its advantages of large passenger capacity and not being affected by traffic congestion. Among the main components of the urban rail transit system, the rail transit train plays a vital role as a vehicle, and the train traction converter controls the traction motor to provide traction or electric braking force for the train operation, and its operational reliability , The service life will directly affect the entire train. [0003] According to statistics, the probability of failure of power switching devices accounts for more than 20% of the probability of failure of electrical components of the converter, and for vehicles running more than 150,000 k...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26
CPCG01R31/2608
Inventor 王磊李兵刁利军徐春梅邱瑞昌郭羽佳王梦珠董超跃
Owner BEIJING JIAOTONG UNIV
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