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Electronic component test system

A technology of electronic components and test systems, which is applied in the parts of electrical measuring instruments, measuring electricity, measuring devices, etc., can solve the problems of improving the test capacity and other problems, and achieve the effect of reducing the test empty window time and improving the test efficiency.

Inactive Publication Date: 2018-12-07
ARKTEK
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  • Summary
  • Abstract
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Problems solved by technology

[0004] As can be seen from the foregoing, when the transfer device removes the tested tray from the electronic component testing device, until the transfer device picks up the untested device again and sends it to the electronic component testing device, the electronic component testing device will wait for the time to change the tray. It becomes an idle state, and this idle state hinders the improvement of test production capacity, so it is urgent to improve

Method used

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  • Electronic component test system
  • Electronic component test system
  • Electronic component test system

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Embodiment Construction

[0050] Please refer to figure 1 , figure 1 It is a main configuration diagram of an embodiment of the electronic component testing system of the present invention. In one embodiment, the electronic component testing system includes a rack 10 , a tray placement area 20 , a testing area 30 , a transfer device 40 in the front area, and a transfer device 50 in the test area. The tray placement area 20 and the test area 30 are adjacently arranged on the frame 10 , and the front area transfer device 40 and the test area transfer device 50 are respectively movably arranged on the frame 10 . The tray placement area 20 is used for placing trays T. As shown in FIG. The testing area 30 includes an electronic component testing device 31 . The transfer device 40 in the front area can move between the tray placement area 20 and the test area 30 , and is used to pick and place the tray T in the tray placement area 20 . The test area transfer device 50 can move within the range of the tes...

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Abstract

The invention discloses an electronic component test system, which comprises a rack, a tray placing area, a test area, a front area transfer device and a test area transfer device. The tray placing area is arranged adjacent to the rack. The test area is arranged adjacently on the rack, and comprises an electronic component test device for testing an electronic component in a tray. The front area transfer device can be movably arranged on the rack in the tray placing area and the test area, and is used for placing trays into the tray placing area. The test area transfer device can be movably arranged on the rack in the test area, and the test area transfer device is used for replacing a tray to be tested and a tested tray.

Description

technical field [0001] The embodiments of the present invention are related to a testing system, in particular to an electronic component testing system. Background technique [0002] By the way, with the development of the electronics industry becoming more and more mature, the client has higher and higher requirements for product yield. Therefore, electronic components such as integrated circuits (IC) must be tested after packaging, and the test results are followed after the test. Classification (bin), and finally make goods or other disposal according to the classification. [0003] However, the electronic component testing system is extremely sophisticated and thus expensive to manufacture. Therefore, the industry is trying to reduce the testing cost and increase the testing capacity. However, in a general testing system, rails are provided within the distribution range of the electronic component testing devices, and the transfer device slides on the rails to pick and...

Claims

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Application Information

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IPC IPC(8): G01R1/02G01R31/01
CPCG01R1/02G01R31/01
Inventor 林源记谢志宏林世芳
Owner ARKTEK
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