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Black box fault injection method and system and medium device

A black box and fault technology, applied in the direction of instrumentation, electrical digital data processing, calculation, etc., can solve the problem of strict requirements of the SUT platform to be tested, and achieve the effect of fast and efficient detection and guaranteed coverage

Active Publication Date: 2018-12-11
NANJING UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Furthermore, this method has many problems in practical application, such as event filtering and security detection, etc., and the requirements of the test platform SUT are relatively strict

Method used

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  • Black box fault injection method and system and medium device
  • Black box fault injection method and system and medium device
  • Black box fault injection method and system and medium device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0061] A black box injection method for dealing with potential faults of the platform to be tested according to Embodiment 1 of the present invention, such as figure 1 shown, including the following steps:

[0062] Step S100, tracking the service calling path of the platform under test.

[0063] As an implementable manner, step S100 includes the following steps:

[0064] Track the business call path of the platform to be tested, and then pass the call chain traced by the platform to be tested for processing, and extract the call chain information.

[0065] Step S200, generating or perfecting a corresponding business architecture diagram according to the business calling path and the extracted information.

[0066] As an implementable manner, step S200 includes the following steps:

[0067] The business in the business call path is mapped to the corresponding point in the business architecture diagram of the platform under test, and the call relationship is mapped to the edg...

Embodiment 2

[0083] Set the complete internal business architecture of the platform to be tested as follows: figure 2 shown. Record the failure of node m as Crash(n), and the failure of information loss between nodes m and n as Omit(m-n).

[0084] (1) if diagram 2-1 As shown, trace the first call chain:

[0085] L1:A1-B1-D1-F1

[0086] Explore the four nodes A1, B1, D1, and F1, and the corresponding three edges;

[0087] The set of failure modes returned is:

[0088] F1={Omit(A1-B1)&Omit(B1-D1)&Omit(D1-F1)}.

[0089] (2) if Figure 2-2 As shown, F1 is injected into the platform under test, the test result is SUCCESS, and the second call chain is traced:

[0090] L2:A1-B2-D1-F2

[0091] Detect two nodes, B2 and F2, and three edges;

[0092] The set of failure modes returned is:

[0093] F2=F1&{Omit(A1-B2)&Omit(B2-D1)&Omit(D1-F2)}

[0094] (3) if Figure 2-3 As shown, F2 is injected into the platform under test, the test result is SUCCESS, and the third call chain is traced:

...

Embodiment 3

[0142] In this embodiment, the specific process of sorting optimization in steps S300 and S500 in the first embodiment is given.

[0143] In Embodiment 2, the present invention explores a complete service path system structure of the system to be tested (such as figure 2 shown), the paths are optimized and sorted, and the corresponding fault scenarios to be injected are designed for each sorted path.

[0144] After using the LDFI (Linear Discriminant Analysis, linear discriminant analysis) method to explore the complete business architecture of the platform to be tested, all the path sets P of the platform to be tested can be obtained, as shown in Table 1:

[0145] Table 1:

[0146]

[0147] As shown in Table 1, the platform to be tested has a total of 40 paths.

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Abstract

The invention discloses a black box fault injection method and system and a medium device. The injection method comprises the following steps: tracing the service invocation path of the platform to betested; generating or perfecting the corresponding service architecture diagram according to the service invocation path and the extracted information; according to the business architecture diagram(BAG), recursively deducing and injecting the fault scenarios that can destroy all the known paths into the platform to be tested; on the basis of exploring the complete architecture of the system under test, optimizing and sorting the paths, and then generating the corresponding fault scenarios for each path. According to the invention, the potential failure of SUT can be detected quickly and efficiently, and a certain coverage is guaranteed.

Description

technical field [0001] The invention relates to the field of computer testing, and is a black-box fault injection method, system and media device based on a service call path that can be applied to system fault tolerance evaluation. technical background [0002] Fault Insertion Test (FIT) is an effective and useful technique for evaluating system platform reliability. The principle of this method is to inject a specific fault into the platform under test (Software UnderTesting, SUT), and monitor the response of the SUT of the platform under test, so as to observe whether the behavior of the SUT in the face of such a fault conforms to expected. [0003] However, in actual scenarios, the platform under test SUT itself may have defects (bugs), for example, errors may occur when two components work together, resulting in the failure of the SUT to provide services normally. These hidden defects (bugs) are often difficult to find, will only be triggered under certain conditions,...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
CPCG06F11/3688
Inventor 聂长海张文茜尹震
Owner NANJING UNIV