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Scattering terahertz near field microscope based on radio frequency electronic method

A scattering and electronic technology, applied in the field of terahertz detection and application, can solve the problems of insufficient power, large transmission loss, low pump power, etc., and achieve the effects of compact structure, increased power of emission source, and low operation difficulty.

Active Publication Date: 2018-12-18
代广斌
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] In order to overcome the bottleneck problem encountered in the existing near-field microscope technology, the present invention provides a scattering terahertz near-field microscope based on radio frequency electronics, which specifically solves the problem of insufficient power in t

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  • Scattering terahertz near field microscope based on radio frequency electronic method
  • Scattering terahertz near field microscope based on radio frequency electronic method

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Embodiment 1

[0033]A scattering terahertz near-field microscope based on radio frequency electronics, including a 27.5GHz radio frequency seed source 21, a 27.475GHz radio frequency seed source 22, a first power divider 23, a second power divider 24, and a first frequency multiplier 25. Second frequency multiplier 26, third frequency multiplier 27, subharmonic mixer 28, directional coupler 29, parabolic mirror 30, piezoelectric ceramic 31, nanoscale curvature probe 32, sample 33, radio frequency mixer Frequency converter 34, 25MHz frequency multiplier 35, 50MHz frequency multiplier 36, 100MHz intermediate frequency mixer 37, lock-in amplifier 38, signal generator 39, computer 42, guiding laser 43, film mirror 44. 40 represents directional coupling 41 represents the THz wave focused by the parabolic mirror and the THz wave received and scattered back, and 45 represents the visible laser emitted by the guide laser. Wherein the 27.5GHz radio frequency seed source 21 is connected with the a en...

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Abstract

The invention provides a scattering terahertz near field microscope based on a radio frequency electronic method. The system comprises a first part: a first radio frequency seed source, a first powerdivider, a first frequency multiplier and a directional coupler; a second part: a second radio frequency seed source, a second power divider, a second frequency multiplier, a mixer; and a parabolic mirror, piezoelectric ceramic, a nanoscale curvature probe, a sample, a radio frequency mixer, a third frequency multiplier, an intermediate frequency mixer, a lock-in amplifier, a signal generator, a computer, a guide laser and a reflective mirror. The scattering terahertz near field microscope provided by the invention provides a local oscillator signal through the radio frequency mixing technology, then perform filtering noise reduction on an intermediate frequency signal output by the mixer, and then extracts near field waves by using the phase lock technology, thereby effectively obtainingthe information of the sample to be tested. At the same time, the scattering terahertz near field microscope provided by the invention has the characteristics of compact structure, simple operation, high detection efficiency, high stability, high operability and the like, and can complete the extraction work of the amplitude and phase of a near field THz weak scattering signal.

Description

technical field [0001] The invention relates to the technical field of terahertz (THz) detection and application, in particular to a terahertz near-field microscope based on a radio frequency electronic method. Background technique [0002] THz wave is a kind of electromagnetic radiation with a wavelength between 30 μm and 3000 μm. Due to its special optical properties such as low radiation, strong penetrability, and easy resonance with biological or semiconductor materials, it has been widely used in solid-state physics and biology. in the study of materials. Because its wavelength is on the order of microns, according to the classic optical Rayleigh criterion, the best resolution that can be achieved by a far-field spectrometer will not be better than half a wavelength. Therefore, in order to achieve the purpose of studying nano-semiconductor devices or biomolecules at the nanoscale, it is necessary to develop a near-field microscope that bypasses the Rayleigh diffraction...

Claims

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Application Information

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IPC IPC(8): G01N21/3581G01N21/01
CPCG01N21/01G01N21/3581G01N2021/0112
Inventor 代广斌
Owner 代广斌