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Depth measurement method, depth measurement device and photographing equipment

A technology of depth measurement and shooting equipment, applied in the field of measurement, can solve the problem of high emission light intensity, and achieve the effects of reducing energy consumption, reducing safety hazards, and reducing power

Active Publication Date: 2020-11-03
GOERTEK OPTICAL TECH CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The main purpose of the present invention is to propose a depth measurement method, which aims to solve the technical problem of high emission intensity of the detection light in the above-mentioned depth measurement process, and reduce the energy consumption in the depth measurement process

Method used

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  • Depth measurement method, depth measurement device and photographing equipment
  • Depth measurement method, depth measurement device and photographing equipment
  • Depth measurement method, depth measurement device and photographing equipment

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Embodiment Construction

[0049] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0050] It should be noted that if there is a directional indication (such as up, down, left, right, front, back...) in the embodiment of the present invention, the directional indication is only used to explain the position in a certain posture (as shown in the accompanying drawing). If the specific posture changes, the directional indication will also change accordingly.

[0051] In addition, if there are descriptions involving "first", "second" and ...

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Abstract

Disclosed are a depth measurement method, a depth measurement apparatus, and a photographing device. The depth measurement method comprises the following steps: obtaining a measured depth interval; determining first preset light intensity of detection light according to the measured depth interval; transmitting the detection light according to the first preset light intensity, and receiving first reflected light generated after the detection light is reflected; and determining a measured depth according to the first reflected light.

Description

technical field [0001] The invention relates to the technical field of measurement, in particular to a depth measurement method, a depth measurement device and a photographing device. Background technique [0002] In order to obtain the depth information of the scene being photographed, depth measurement can be performed through structured light. In structured light depth measurement, by emitting detection light and receiving the reflected light generated by the reflected detection light, the depth is determined according to the reflected light. In order to ensure the stability of the measurement and avoid measurement failure caused by the large attenuation of the detection light during transmission, the emission intensity of the detection light is usually determined according to the maximum depth required for measurement. However, in some cases, most of the measured depths may be smaller than the maximum depth, so the emission intensity of the detection light required is a...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/22
CPCG01B11/22
Inventor 吕思豪
Owner GOERTEK OPTICAL TECH CO LTD
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