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Microscope comprising groups of light emitters for illumination, and microscopy method

A microscopic imaging and microscope technology, applied in the field of microscopy, can solve the problem of no contribution to imaging, and achieve the effect of avoiding artifacts and avoiding burning

Inactive Publication Date: 2018-12-21
CARL ZEISS MICROSCOPY GMBH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This prevents confocal imaging, where pinholes are used to block light from above and below the focal plane so that such light does not contribute to imaging

Method used

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  • Microscope comprising groups of light emitters for illumination, and microscopy method
  • Microscope comprising groups of light emitters for illumination, and microscopy method
  • Microscope comprising groups of light emitters for illumination, and microscopy method

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Embodiment Construction

[0043] The microscope 10 includes an illumination device 12, a detection device 14 and a control device 16. The microscope 10 is configured to produce an image of an object 18 in a wide field of view. To this end, the illuminating device 12 generates illuminating radiation 20 in a wide field of view, and the object 18 is illuminated with the illuminating radiation 20. The illuminating radiation 20 passes through the beam splitter 22, the zoom optics 24 and the objective lens 26. The task of the zoom optics 24 is to image the illuminating device 12 onto the object 18 with different magnification ratios. The objective lens 26 is used to focus the illuminating radiation 20 onto the object 18.

[0044] Present in the object 18 is a fluorescent dye, which is excited by the illuminating radiation 20 to emit emitted light. The light emitted or reflected by the object 18 is collected by the objective lens 26 and guided from the zoom optics 24 to the beam splitter 22 as imaging radiati...

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PUM

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Abstract

The invention relates to a microscope (10) for imaging an object (18) in an object field, comprising an illumination device (12, 112, 212, 312) for wide-field illumination of the object (18), whereinthe illumination device (12, 112, 212, 312) has a plurality of light sources (36), a detection device (14) for recording a wide-field image of the object (18), and a control device (16) for controlling the detection device (14) and the illumination device (12, 112, 212, 312). The control device (16) divides the light sources (36) into at least two groups (50a, 50b), wherein the light sources (36)of all groups combined fill the object field entirely. The control device (16) for each group switches on all light sources (36) of said group (50a, 50b), causes the detection device (14) to record asingle image of the object (18), switches off the light sources (36) of said group (50a, 50b), and thus interconnects all groups, and generates a plurality of single images. From the generated singleimages, an image of the object (18) is generated by the control device (16).

Description

Technical field [0001] The invention relates to a microscope for imaging an object in an object field, wherein the microscope comprises: an illumination device for illuminating the object with a wide field of view, the illumination device having a plurality of light sources; and a wide field of view for shooting the object Image detection device; and control device for controlling detection device and motion device. The invention also relates to a microscopic imaging method for imaging an object in an object field. The object is illuminated in a wide field of view using an illuminating device with multiple light sources. Background technique [0002] In classic optical microscopes, when viewing three-dimensionally stretched objects, that is, objects whose stretch along the optical axis is greater than the depth of field of the objective lens used, the problem arises that the clear image is superimposed on the out-of-focus image components that are not clear. This prevents confoc...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G02B21/08G02B21/16G02B21/36G02B27/48
CPCG02B21/082G02B21/16G02B21/367G02B27/48G02B21/06
Inventor 因格·克莱珀托马斯·卡尔克布莱纳
Owner CARL ZEISS MICROSCOPY GMBH