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Method and device for predicting characteristic data of integrated circuit components

A characteristic data, integrated circuit technology, applied in the field of integrated circuit component characteristic data prediction, can solve the problems of incomplete matching between the points corresponding to the interpolation, large errors, unsatisfactory interpolation effect, etc., and achieves simple and easy implementation and low cost. , the effect of reducing the cost of testing

Active Publication Date: 2020-06-19
TSINGHUA UNIV
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

[0004] like figure 1 As shown, to solve the problem of data prediction in the circuit, traditional interpolation methods can be used, such as spline interpolation, but the points corresponding to the interpolation are not completely matched, resulting in unsatisfactory interpolation results and large errors

Method used

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  • Method and device for predicting characteristic data of integrated circuit components
  • Method and device for predicting characteristic data of integrated circuit components
  • Method and device for predicting characteristic data of integrated circuit components

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Embodiment Construction

[0029] Embodiments of the present invention are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals designate the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary and are intended to explain the present invention and should not be construed as limiting the present invention.

[0030] The method and device for predicting characteristic data of integrated circuit components according to the embodiments of the present invention will be described below with reference to the accompanying drawings. First, the method for predicting characteristic data of integrated circuit components according to the embodiments of the present invention will be described with reference to the accompanying drawings.

[0031] figure 2 It is a flowchart of a method for predicting characteristic data of integrated circuit compon...

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Abstract

The invention discloses a method and a device for predicting characteristic data of an integrated circuit components and parts. The method comprises the following steps: segmenting a characteristic curve of a device to be tested to obtain a segmented characteristic curve; generating the same number of data points on each segment of curve in the segmented characteristic curve, and performing splineinterpolation prediction on each segment of curve to obtain a prediction curve; and when the prediction curve does not satisfy a preset condition, performing spline interpolation on the prediction curve to obtain the necessary data points. According to the method, the problem that an interpolation point cannot be directly matched is effectively solved by performing segmented interpolation on on the curve linetype, the number of test points of each device can be effectively reduced, thereby effectively reducing the overall test cost, effectively improving the practicability of prediction, andensuring low cost, high efficiency and simple and easy implementation.

Description

technical field [0001] The invention relates to the technical field of circuit data prediction, in particular to a method and device for predicting characteristic data of integrated circuit components. Background technique [0002] At present, under advanced process nodes, statistical testing of components considering process fluctuations is a very important task. In this task, a large number of components need to be tested, which often takes a lot of time and cost. The efficiency is low and the cost is high. Poor practicality. Contents of the invention [0003] This application is made based on the inventor's recognition and discovery of the following problems: [0004] Such as figure 1 As shown, to solve the problem of data prediction in the circuit, traditional interpolation methods can be used, such as spline interpolation, but the points corresponding to the interpolation are not completely matched, resulting in unsatisfactory interpolation results and large errors....

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28
CPCG01R31/2851
Inventor 王燕潘志建叶佐昌张进宇
Owner TSINGHUA UNIV
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