Measuring method and system for elasticity modulus of polymer

A technology of elastic modulus and measurement method, applied in the field of measurement method and system of elastic modulus of polymers, can solve problems such as inaccurate elastic modulus value, and achieve the effects of improving measurement accuracy and data processing efficiency and accuracy

Active Publication Date: 2019-01-25
YANSHAN UNIV
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Problems solved by technology

However, since there is no clear curve fitting range, the polymer elastic modulus value obtained by

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  • Measuring method and system for elasticity modulus of polymer
  • Measuring method and system for elasticity modulus of polymer
  • Measuring method and system for elasticity modulus of polymer

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[0047] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0048] The purpose of the present invention is to provide a method and system for measuring the elastic modulus of polymers, and clearly select the method for the fitting range, so that the Hertz model can be used to fit the loading curve easily and accurately, so that the calculated elastic modulus value of the polymer can be obtained. more precise.

[0049] In order to make the above objects, features and advantages of the present invention more comprehensib...

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Abstract

The invention discloses a measuring method and system for elasticity modulus of a polymer. The method comprises the steps that a load-displacement curve is acquired; the load-displacement curve is a change curve of load applied to a probe of an atomic force microscope with displacement of a piezoelectric ceramics scanning pipe when the atomic force microscope is used for conducting a nanoindentation experiment on a polymer sample; the load-displacement curve is converted into a force curve; the force curve comprises a loading curve and an unloading curve; a first turning point of the loading curve is determined; data points behind the first turning point of the loading curve are deleted, and data points before the first turning point of the loading curve are reserved; the data points before the first turning point are subjected to fitting through a hertz model to obtain fitting data; according to the fitting data and a hertz model calculating formula, the elasticity modulus of the polymer sample is calculated. According to the method, the fitting range can be definitely selected, therefore the Hertz model can be conveniently and accurately utilized for conducting fitting on the loading curve, and the obtained elasticity modulus of the polymer can be more accurate after calculation.

Description

technical field [0001] The invention relates to the field of ultra-precision machining, in particular to a method and system for measuring elastic modulus of polymers. Background technique [0002] With people's continuous exploration in the micro / nano field, higher requirements are put forward for detection equipment, and atomic force microscopes (AFM for short) stand out for their excellent performance. As a practical ultra-precision detection equipment, the atomic force microscope can not only obtain the real three-dimensional shape information of the sample, but also can freely select the indentation area and image the indentation area in time in AFM nanoindentation. field has been increasingly applied. AFM nanoindentation can be used to measure the elastic modulus of materials. Currently, the commonly used calculation models are Oliver&Pharr model and Hertz model. When using AFM nanoindentation to measure the elastic modulus of polymer materials (such as PC, PMMA), du...

Claims

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Application Information

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IPC IPC(8): G01N3/08
CPCG01N3/08G01N2203/0003G01N2203/0019G01N2203/0078
Inventor 陈建超安小广宋光明米文轩
Owner YANSHAN UNIV
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