A method and device for testing uart communication compatibility of batch products

Abstract

The invention discloses a method and device for testing the UART communication compatibility of batch products, and belongs to a compatibility testing technology in the field of communication. The keyof the method is as follows: according to the expectant internal clock limit values (the maximum value and the minimum value) of the batch products in the chip design, parameter extreme values of test equipment capable of normally communicating are calculated and configured; a tested sample is tested; if the test is passed, design of the batch products is reasonable; the reserved allowance is sufficient; if the test fails, whether the internal clock of the tested sample accords with the expectation or not is further analyzed; furthermore, communication parameters of the test equipment are configured according to the internal clock value; and whether communication is normal or not is tested. By means of the method, the number of randomly tested samples can be greatly reduced; and the evaluation result is relatively accurate.

Description

technical field [0001] The invention relates to compatibility testing technology in the communication field, in particular to a method and device for testing UART communication compatibility of batch products. Background technique [0002] Universal Asynchronous Receiver / Transmitter (Universal Asynchronous Receiver / Transmitter), commonly referred to as UART, is a universal serial data bus for asynchronous communication. The bidirectional communication of the bus can realize full-duplex transmission and reception, and the bus structure is simple, requiring only two data lines of receiving (Rx) / sending (Tx). [0003] Since there is no clock signal on the bus, both communication parties must send and receive at a regular time, and each device must have a separate clock for timing. When there is a slight asynchrony between the two communication devices, the clock synchronization can be calibrated by transmitting the timing of the stop bit. When there is a large clock asynchrony...

AI Technical Summary

Problems solved by technology

[0007] The embodiment of the present invention provides a method and device for testing UART communication compatibility of batch products, which is used to solve the problem of poor accuracy and low efficiency of UART communication compatibility of batch chip products that use the internal clock of the chip for testing.

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