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A testing method, device and electronic equipment

A test method and technology of equipment to be tested, applied in the computer field, can solve problems such as difficult to improve test efficiency, heavy test tasks and personnel cost control

Active Publication Date: 2021-07-06
BEIJING YUNCE INFORMATION TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The embodiment of the present application provides a test method, device and electronic equipment to solve the problem in the prior art that it is difficult to improve the test efficiency under the condition of increasingly heavy test tasks and stricter personnel cost control

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  • A testing method, device and electronic equipment
  • A testing method, device and electronic equipment
  • A testing method, device and electronic equipment

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Embodiment Construction

[0038] In order to make the purpose, technical solution and advantages of the present application clearer, the technical solution of the present application will be clearly and completely described below in conjunction with specific embodiments of the present application and corresponding drawings. Apparently, the described embodiments are only some of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of this application.

[0039] The technical solutions provided by various embodiments of the present application will be described in detail below in conjunction with the accompanying drawings.

[0040] In order to solve the problem that the testing method in the prior art is difficult to improve the testing efficiency, the embodiment of this specification provides a testin...

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Abstract

The application discloses a testing method, device and electronic equipment thereof, which are used to solve the problem that the testing method in the prior art is difficult to improve the testing efficiency. The method includes: acquiring a test task and a test process corresponding to the test task, wherein the test process includes a plurality of sequentially arranged test steps; according to the test task, determining a device to be tested that matches the test task; Determine the relationship between the test nodes corresponding to the functional modules in the device to be tested and the test steps; based on the test process, distribute the test steps to the associated test nodes for testing.

Description

technical field [0001] The present application relates to the field of computer technology, in particular to a testing method, device and electronic equipment. Background technique [0002] At present, when performing automated testing on applications installed in terminal devices, it is often based on the test process and test scenarios to design and record automated test scripts under the existing automated test framework, and then serially or The test script is run in parallel to realize the test of the application program installed in the terminal device. [0003] In related technologies, since different functional modules in the terminal device are often involved in the test process, testers need to test all the functional modules in the terminal device according to the test process, and the test efficiency is low. [0004] Therefore, there is an urgent need for a testing method to improve testing efficiency. Contents of the invention [0005] The embodiments of the...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/36
CPCG06F11/3684G06F11/3688
Inventor 戴亦斌陈鹏
Owner BEIJING YUNCE INFORMATION TECH CO LTD