A mobile testing device for electronic components

Abstract

The invention discloses a mobile testing device for electronic components. By improving the partial structure of the equipment, the delay return mechanism on the device can be pushed by the electronic components, so that the power supply can be controlled so that the power supply can be energized after a period of delay. , which effectively prevents the electronic components from being inserted into the detection slot when the power is on, resulting in poor contact and generating electric sparks, thereby causing damage to the equipment. At the same time, the temperature detection component can detect damaged electronic components when the equipment detects, Before the short-circuit temperature is too high and the equipment is damaged, the power-off protection component is controlled to cut off the power to protect the parts of the detection tank. Its structure includes a detection mirror, a welding block, a moving turntable, a base, a rotating connecting block, a support column, and a testing device. , the detection mirror is located directly above the welding block, the bottom of the test device is welded to the top of the moving turntable, the base is located directly below the moving turntable, and the top of the base is provided with a rotating connecting block, and the two are flexibly connected.

Description

technical field [0001] The invention relates to the field of electronic testing equipment, in particular to a mobile testing device for electronic components. Background technique [0002] The electronic component mobile test device is a kind of equipment for testing the function of electronic components. By providing power to the electronic components to detect the working state of the electronic components, it is ready for delivery. However, when the existing equipment is used for testing, the electronic When the components are inserted into the detection slot for power-on detection, if the power is not fully inserted or the connection power is not turned off, it is easy to cause poor contact at the connection, resulting in high-temperature arcs, which will damage the electronic components. When the electronic components themselves are not in compliance, it is very easy to cause the voltage of the electronic components to be too high and the temperature to rise suddenly du...

AI Technical Summary

Problems solved by technology

[0002] The electronic component mobile test device is a kind of equipment for testing the function of electronic components. By providing power to the electronic components to detect the working state of the electronic components, it is ready for delivery. However, when the existing equipment is used for testing, the electronic When the components are inserted into the detection slot for power-on detection, if the power is not fully inserted or the connection power is not turned off, it is easy to cause poor contact at the connection, resulting in high-temperature arcs, which will damage the electronic components. When the electronic components themselves do not meet the requirements, it is very easy to cause the voltage of the electronic components to be too high and the temperature to rise suddenly during the power-on detection, which will cause damage to the detection connection.

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