Image type electronic spinning analyzer

Abstract

The invention provides an image type electronic spinning analyzer. The image type electronic spinning analyzer comprises an electronic optical system, a scattering target and a two-dimensional image type electronic detector; the electronic optical system comprises a nonaxisymmetrical lens group and a magnetic field, the nonaxisymmetrical lens group is matched with the magnetic field to separate the movement track of incident electrons from the movement track of outgoing electrons so as to increase the degree of freedom of geometric configuration of various components of the spinning analyzer,the incident electrons deflect and are imaged to a specific plane which corresponds to a reflecting target, electrons which are scattered by the scattering target are imaged on the two-dimensional image type electronic detector to form two-dimensional electron strength images, and therefore, spinning multichannel measurement of the electrons is realized; and by introduction of nonaxisymmetrical lenses, asymmetry of the optical property of the electrons of the magnetic field in directions which are perpendicular and parallel to the magnetic field can be compensated, aberration of the optical system is relieved, and debugging of the electronic optical system is simple.

Description

technical field [0001] The invention relates to the field of electron spin analysis, in particular to an image type electron spin analyzer. Background technique [0002] At present, analyzers for measuring electron spin mainly include Mott type, Spin-LEED type, and VLEED type analyzers. Among them, the measurement method of the Mott-type analyzer is: first accelerate the electrons to a kinetic energy of 20-100KeV, and then make the electrons scatter on a target with a high spin-orbit interaction material (usually composed of high atomic number elements), by measuring the scattered electrons The spin of the incident electron is measured by the asymmetry of the intensity; the Spin-LEED analyzer measures the intensity of the diffraction spot of the electron on the single crystal surface of a material with high spin-orbit interaction (such as tungsten, iridium, platinum, topological insulator, etc.) Symmetry to measure the spin of electrons; VLEED is a recently developed new an...

AI Technical Summary

Problems solved by technology

[0005] In view of the shortcomings of the prior art described above, the purpose of the present invention is to provide an image-type electron spin analyzer, which is used to solve the problems of low measurement efficiency, large aberration, and optical system problems of multi-channel electron spin analyzers in the prior art. Difficulty debugging and other issues

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