A comprehensive performance evaluation method for large complex repairable devices
A comprehensive performance evaluation and complex technology, applied in data processing applications, instruments, calculations, etc., can solve problems such as difficulty in comprehensively evaluating the operation requirements of large and complex repairable devices, and affecting the better application and development of large and complex repairable devices.
Active Publication Date: 2021-03-12
LASER FUSION RES CENT CHINA ACAD OF ENG PHYSICS
View PDF4 Cites 0 Cited by
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
In summary, various influencing factors make it difficult to comprehensively evaluate whether large complex repairable devices meet the operational requirements, which directly affects the better application and development of large complex repairable devices
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View moreImage
Smart Image Click on the blue labels to locate them in the text.
Smart ImageViewing Examples
Examples
Experimental program
Comparison scheme
Effect test
Embodiment 1
[0043] A comprehensive performance evaluation method for large and complex repairable devices, comprising the following steps:
[0044] First, establish a comprehensive performance evaluation index library, which is divided into multiple classification indexes. For large-scale complex and repairable scientific experimental devices, the inventor divides the classification indexes from the perspective of "user device" into The number of missions performed in a year, mission success rate, mission interval time, average repair time, device service life, and device availability.
[0045] Among them, the number of annual execution tasks is an index to characterize the comprehensive performance of the device, which depends on the basic reliability of each subsystem that composes the device and the maintenance and support resources of the device to achieve it together. The task success rate refers to the probability that the device executes the task (to achieve the purpose of the expe...
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More PUM
Login to View More Abstract
The invention discloses a comprehensive performance evaluation method of a large complex repairable device, comprising the following steps: establishing a comprehensive performance evaluation index database-decomposing the topological structure of the device, and decomposing it into multiple subsystems-according to the comprehensive performance The evaluation index library conducts task profile analysis on the device-builds an index system, which includes the average time between delayed failures, the average number of times between failed failures and the average maintenance time-establishes mathematical expressions and analyzes the scope of tasks ‑‑decompose the index system and determine the weighting factor‑‑comprehensive calculation to obtain the comprehensive performance evaluation result of the device. In view of the intrinsic operating characteristics of large and complex repairable devices, the present invention establishes reliability, maintainability, The support index system effectively converts the overall indicators of availability, task success rate and average maintenance time into testable and evaluable decomposition indicators, which are used to guide the development of device engineering, with high economic benefits.
Description
technical field [0001] The invention relates to the technical field of comprehensive processing of large complex repairable devices, in particular to a method for comprehensive performance evaluation of large complex repairable devices. Background technique [0002] Large-scale devices refer to the large number of components and subsystems of the device. The complexity of the device refers to the complexity of the relationship between them due to the large number of components and subsystems. Most of the large and complex devices in actual engineering are repairable. Due to the requirements of operating tasks and operating efficiency, large-scale and complex repairable devices have requirements for their comprehensive performance such as reliability, maintainability, and support. At the same time, large and complex repairable devices have the characteristics of multi-stage work tasks. In some of the task stages, maintainability and support can be used to supplement the lack...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More Application Information
Patent Timeline
Login to View More Patent Type & Authority Patents(China)
IPC IPC(8): G06Q10/06
CPCG06Q10/06393
Inventor 唐菱马驰邓学伟汪凌芳郭良福唐军袁强袁晓东胡东霞
Owner LASER FUSION RES CENT CHINA ACAD OF ENG PHYSICS