Method and device for evaluating soft error rate of electronic devices
A soft error rate, electronic device technology, applied in the field of radiation effects of electronic devices, can solve the problems of soft error rate distinction, inability to target protection, etc.
Active Publication Date: 2020-12-29
CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST
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[0005] The purpose of the present invention is to provide a method and device for evaluating the soft error rate of electronic devices, so as to solve the problem that the existing method for evaluating the soft error rate of electronic devices cannot distinguish the soft error rates caused by alpha particles, high-energy neutrons and thermal neutrons. The problem of carrying out targeted protection against different soft error rate sources
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[0062] In order to enable those skilled in the art to better understand the technical solutions of the present invention, the present invention will be further described in detail below in conjunction with the accompanying drawings.
[0063] In the description of the present application, it should be noted that the terms "upper", "lower", "inner", "outer", "front", "rear", "left" and "right" etc. indicate orientation or position The relationship is an orientation or positional relationship based on the working state of the application, which is only for the convenience of describing the application and simplifying the description, rather than indicating or implying that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, Therefore, it should not be construed as limiting the application. In addition, the terms "first", "second", "third" and "fourth" are used for descriptive purposes only and should not be const...
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The invention discloses a method and device for evaluating soft error rate of an electronic device. After judging whether the electronic device is sensitive to thermal neutrons according to the content of <10>B isotope, in the method, total soft error rate of the same electronic device is tested at different altitudes for many times, thereby achieving a purpose of distinguishing soft error rates of high-energy neutrons, thermal neutrons and alpha particles; all soft error rates are calculated according to the soft error rates measured in real atmospheric conditions, so that the result is morereliable; and besides, separate measurement of the soft error rates of high-energy neutrons, thermal neutrons and alpha particles is avoided, thereby avoiding the disadvantage that the soft error rates of the thermal neutrons and the alpha particles are not easy to measure, and greatly reducing complexity and cost of soft error rate evaluation of the electronic device.
Description
technical field [0001] The invention relates to the field of radiation effects of electronic devices, in particular to a method and device for evaluating soft error rates of electronic devices. Background technique [0002] Soft errors are random, temporary changes of state or transients in electronic devices caused by the interaction between energetic particles and silicon. There are two main sources of soft errors in electronic devices operating on the ground and in the atmosphere: 1) decay of radioactive impurities in packaging materials; 2) atmospheric neutrons. The soft error rate of electronic devices determines the failure rate of the corresponding electronic system, which is very important for applications with high reliability requirements such as aviation, communication, finance, and medical treatment. As semiconductor process nodes continue to shrink, the impact of soft errors will become increasingly severe. In view of this, it is of great significance to evalu...
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IPC IPC(8): G01R31/00
CPCG01R31/001
Inventor 彭超雷志锋张战刚何玉娟黄云恩云飞
Owner CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST