An analog circuit fault test and diagnosis method

Abstract

The invention discloses an analog circuit fault test diagnosis method, which comprises the following steps of: acquiring fault information at each test node of a circuit to be diagnosed by adopting different types of power supply signals as test excitation signals; Determining an optimal test excitation signal and an optimal test node set by using a fuzzy clustering FCM algorithm according to thecollected fault information; Respectively acquiring fault feature information of the circuit in the determined optimal test node set; Carrying out dimension reduction on the fault feature informationby adopting a sparse random projection method, and carrying out normalization processing to obtain a preprocessed fault sample; And carrying out fault diagnosis on the fault sample by using a naive Bayes classifier. According to the invention, the optimal test excitation signal and the optimal test node set can be automatically selected, and the effect of analog circuit fault diagnosis is greatlyimproved. By adopting the sparse random projection method, redundancy and interference components of fault characteristic attribute types are removed, and the data preprocessing time can be saved.

Description

technical field [0001] The invention relates to the technical field of analog circuit testing, in particular to an analog circuit fault test and diagnosis method. Background technique [0002] Analog circuits are electronic circuits that process analog signals, that is, continuous signals in both time and amplitude, which exhibit many complex characteristics in fault diagnosis. Although many experts and scholars at home and abroad have carried out a lot of research on analog circuit fault diagnosis, and many analog circuit fault diagnosis methods have emerged, it is precisely because of the characteristics of analog circuit that the existing analog circuit fault diagnosis methods are not perfect. Based on the analysis and summary of the existing domestic and foreign analog circuit fault diagnosis research, it is found that there are still some problems in the existing analog circuit fault diagnosis methods: [0003] (1) The effect of analog circuit fault diagnosis is closel...

AI Technical Summary

Problems solved by technology

[0008] Purpose of the invention: In order to overcome the deficiencies of the prior art, the present invention provides an analog circuit fault test and diagnosis method, which can solve the problem of low fault diagnosis rate and efficiency, failure to cover all fault types, and adaptability to temperature and noise environments problem of influence

Images