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Test method for solar cell grid line shading rate

A technology of a solar cell and a test method, applied in the field of solar power generation, can solve the problems of inability to evaluate the impact of battery performance, inability to evaluate the impact of light on battery performance, and inaccurate grid shading rate.

Active Publication Date: 2019-05-10
CSI CELLS CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The above test method cannot evaluate the impact of the scattered paste near the grid line on the performance of the battery
[0007] Third, the grid lines of the battery are three-dimensional geometric structures, with height and contour, from figure 2 It can be seen from the cross-sectional diagram of the grid line that the incident light A will be reflected by the metal material with high reflectivity to the surface of the silicon wafer B and be reused. The above test method cannot evaluate the influence of the re-used light on the performance of the battery.
[0008] In summary, using an optical microscope to measure the line width and spacing and calculate the shading rate of the grid line is not accurate enough, which will bring errors to the characterization, analysis, and optimization of the battery

Method used

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  • Test method for solar cell grid line shading rate
  • Test method for solar cell grid line shading rate
  • Test method for solar cell grid line shading rate

Examples

Experimental program
Comparison scheme
Effect test

specific Embodiment approach 1

[0035] A method for testing the shading rate of a solar cell grid wire 200 provided in the first embodiment of the present invention includes the following steps:

[0036] See image 3 , step a): make the quantum efficiency tester emit a light spot 100 of a specific wavelength, adjust the position of the light spot 100 to make it parallel to the grid line 200, and obtain the EQE value of the light spot 100; adjust the wavelength of the light spot 100 within a specific wavelength range to obtain a series of first EQE values;

[0037] See Figure 4 , step b): make the quantum efficiency tester emit a spot 100 of a specific wavelength, adjust the position of the spot 100 to make it perpendicular to the grid line 200, and obtain the EQE value of the spot 100; adjust the wavelength of the spot 100 within a specific wavelength range to obtain a series of second EQE values;

[0038] Step c): subtracting the second EQE value from the corresponding first EQE value to obtain a series...

specific Embodiment approach 2

[0071] To make the description concise, only the differences between the present embodiment and the first embodiment will be described in detail below.

[0072] In step b) of Embodiment 1, it is necessary to move the light spot, change the position of the light spot relative to the grid line, and perform multiple tests to obtain multiple series of second EQE values, and then calculate the average value to obtain a more accurate series of second EQE values. Two EQE values.

[0073] In this embodiment, in step b), it is also necessary to record the number n of grid lines covered by the light spot; in addition, in step b), there is no need to move the position of the light spot, only a set of second EQE values ​​needs to be tested, but through the following The correction step of is to obtain the shading rate of the grid lines.

[0074] The corrective steps include:

[0075] Step e): using an optical microscope to test to obtain the grid line pitch P; record the length L of the...

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Abstract

The invention discloses a more accurate test method for a solar cell grid line shading rate. The test method for the solar cell grid line shading rate comprises the following steps that a, a quantum efficiency tester is caused to emit a light spot of a certain wavelength, and a position of the light spot is adjusted to be parallel to grid lines so that an EQE value of the light spot is obtained, wherein wavelength is adjusted within a certain wavelength range and a series of first EQE values are obtained; b, the quantum efficiency tester is caused to emit the light spot of the certain wavelength, and a position of the light spot is adjusted to be vertical to the grid lines so that an EQE value of the light spot is obtained, wherein the wavelength is adjusted within a certain wavelength range and a series of second EQE values are obtained; c, a series of difference values are obtained by subtracting the first EQE values from the second EQE values; d, a mean value of the difference values is calculated so that the shading rate is obtained; and in step a and b, the wavelength of the light spot of the series of first EQE values are in one-to-one correspondence with that of the light spot of the series of second EQE values.

Description

technical field [0001] The invention relates to a method for testing the shading rate of grid lines of solar cells, belonging to the technical field of solar power generation. Background technique [0002] Existing solar cells collect current by printing and sintering grid electrodes on the surface of silicon wafers. While collecting current, grid electrodes also shade light. The shading rate will affect the efficiency of solar cells. How to accurately test grid lines The shading rate is a problem that needs continuous optimization. [0003] The current method of testing the shading rate of the grid lines is to measure the width W of the grid lines and the pitch P of the grid lines through an optical microscope, and calculate the shading rate of the grid lines by the formula f=W / P. [0004] There are three main problems with this test method: [0005] First, if figure 1 As shown, due to the limitation of the paste and the screen, the boundary of the grid line is not a cle...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H02S50/10
CPCY02E10/50
Inventor 李硕陈瑶
Owner CSI CELLS CO LTD