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Method, system and equipment for rapidly and efficiently testing shading rate of solar cell

A technology of solar cells and testing methods, which is applied in the field of solar power generation, can solve the problems of acquisition gradient, large influence of line shape uniformity, poor accuracy and repeatability, and complicated operations, so as to reduce testing manpower, achieve accurate shading rate, and test high efficiency effect

Pending Publication Date: 2022-07-12
ZHEJIANG AIKO SOLAR ENERGY TECH CO LTD +3
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

During this period, it is necessary to adjust the spot direction twice and test multiple point data. The operation is complicated and time-consuming. It is greatly affected by the collection gradient and line shape uniformity, and the accuracy and repeatability of the results are poor.

Method used

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  • Method, system and equipment for rapidly and efficiently testing shading rate of solar cell
  • Method, system and equipment for rapidly and efficiently testing shading rate of solar cell
  • Method, system and equipment for rapidly and efficiently testing shading rate of solar cell

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Embodiment Construction

[0030] In order to make the objectives, technical solutions and advantages of the present invention clearer, the present invention will be further described in detail below with reference to the accompanying drawings.

[0031] like figure 1 shown, figure 1 A real-time flow of a fast and efficient test method for solar cell shading rate is shown, including:

[0032] S101, obtaining a reference grayscale image.

[0033] The reference grayscale image is a solar cell printing sample image pre-drawn by the user and stored in a corresponding memory, and the reference grayscale image includes a front reference grayscale image and a back reference grayscale image. like figure 2 As shown, the front reference grayscale image includes a reference edge 1, a front reference frame 2, a front reference busbar 3 and a front reference fine grid 4; such as image 3 As shown, the backside reference grayscale image includes a reference silicon wafer edge 1, a backside reference frame 5, a ba...

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Abstract

The invention discloses a fast and efficient testing method for the shading rate of a solar cell. The method comprises the steps of performing image processing on a target gray level image; converting the reference gray level image into a reference gradient histogram; converting the processed target grayscale image into a target gradient histogram; performing coincidence comparison on the reference gradient histogram and the target gradient histogram to extract target features, wherein the target features comprise target edge and target internal feature units; counting the number of pixel points in the area of the target edge to obtain the total number of the pixel points; counting the number of pixel points of the target internal feature unit to obtain the number of pixel points of a printed pattern; and calculating the shading rate according to the total number of the pixel points and the number of the pixel points of the printed pattern. Correspondingly, the invention further discloses a test system related to the test method and computer equipment. By adopting the method and the device, the test efficiency is high, the repeatability and the accuracy of a test result are improved, and the test manpower and time cost is reduced.

Description

technical field [0001] The present invention relates to the technical field of solar power generation, in particular to a method, system and equipment for testing the shading rate of solar cells quickly and efficiently. Background technique [0002] An existing test method for the shading rate of a solar cell is "Testing Method for the Shading Rate of a Solar Cell Grid Line", and the application number is CN201811602273.8. The technical solution is: use a quantum efficiency tester to test the EQE value, the quantum efficiency tester emits a light spot of a specific wavelength, adjust the position of the light spot to make it parallel to the grating line, and obtain the EQE value of the light spot; adjust the light spot within a specific wavelength range. wavelength to obtain a series of first EQE values; the quantum efficiency tester emits a light spot of a specific wavelength, adjust the position of the light spot to make it perpendicular to the grating line, and adjust the...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06T7/10G06T7/90G06T5/00G06T5/40
CPCG06T7/0004G06T7/10G06T7/90G06T5/40G06T2207/10004G06T2207/30148G06T5/73G06T5/70Y02E10/50
Inventor 晋亚铭叶晓钟马荣锋王成林
Owner ZHEJIANG AIKO SOLAR ENERGY TECH CO LTD