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AOI (Automated Optical Inspection)-based display panel micro defect judgment method and device

A technology of display panel and judgment method, applied in the direction of optical testing flaws/defects, etc., can solve the problem of inability to accurately classify and detect small defects, achieve fast, effective and accurate detection and judgment of small defects, improve resolution and clarity, reduce The effect of over-detection and missed-detection rates

Inactive Publication Date: 2019-06-07
WUHAN JINGLI ELECTRONICS TECH +1
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Problems solved by technology

[0004] The embodiment of the present application provides an AOI-based method and device for judging tiny defects of a display panel, which solves the problem in the prior art that it is impossible to accurately classify and detect tiny defects through panel images

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  • AOI (Automated Optical Inspection)-based display panel micro defect judgment method and device
  • AOI (Automated Optical Inspection)-based display panel micro defect judgment method and device
  • AOI (Automated Optical Inspection)-based display panel micro defect judgment method and device

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Embodiment Construction

[0042] In order to better understand the above-mentioned technical solution, the above-mentioned technical solution will be described in detail below in conjunction with the accompanying drawings and specific implementation methods.

[0043] In the panel AOI equipment produced by major equipment manufacturers, the ratio of panel pixels to image pixels is usually 1:3, that is, a single subpixel image on the panel only accounts for 3*3=9 pixels, while in the application of microscopic defect detection and classification, The customer requires the detection accuracy to reach 0.25subpixel of the panel, and the image corresponding to the large camera is 0.25 / 3*9=0.75pixel. However, in the image processing process of large cameras, it is difficult to achieve a detection accuracy of 0.75 pixel considering factors such as the accuracy of the algorithm, the influence of noise, and the halo phenomenon of the liquid crystal image. In addition, defects such as Cell foreign matter, double ...

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Abstract

The invention belongs to the technical field of display defect detection and discloses an AOI (Automated Optical Inspection)-based display panel micro defect judgment method and device. According to the method and device of the invention, the position of a micro defect is detected through a large camera; secondary image acquisition is performed on the micro defect through a small camera; analysisprocessing is performed; and finally a defect type is outputted. With the method and device of the invention adopted, small defects can be accurately classified, and the correct degradation classification of panels can be realized.

Description

technical field [0001] The invention relates to the technical field of defect detection of display screens, in particular to an AOI-based method and device for judging tiny defects of a display panel. Background technique [0002] With the development of the LCD (Liquid Crystal Display, liquid crystal display) panel inspection industry, manufacturers have higher and higher requirements for panel inspection, and have different degraded specifications for different types of defects. In order to correctly degrade the output of the panel, AOI (Automated Optical Inspection) equipment needs to accurately classify the detected defects, and degrade the classified defects according to the customer's requirements. [0003] The existing AOI equipment uses a large-resolution camera to detect the panel. The resolution of tiny defects (defects with an area between 0.25-6subpixel) in the entire panel image is very low, and it is impossible to accurately classify and detect them through the...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/95
Inventor 李渊张胜森程果郑增强
Owner WUHAN JINGLI ELECTRONICS TECH
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