Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

CT (Computed Tomography) spatial resolution measurement method for improving disc card method

A technology of spatial resolution and measurement method, which is applied in the field of image processing and can solve the problems of insufficient manufacturing precision of the disc card, complicated testing process and great influence.

Active Publication Date: 2019-06-14
CHONGQING UNIV
View PDF3 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The disc card is easy to make, but the test process is complicated, and the test results require complicated calculations
In the calculation process of the disc card method, due to the noise and the insufficient precision of the disc card, this has a great impact on the most important step in the test process, that is, the calculation of the average gray level, and the final result of the spatial resolution will be different from the real one. There is a certain gap in the value

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • CT (Computed Tomography) spatial resolution measurement method for improving disc card method
  • CT (Computed Tomography) spatial resolution measurement method for improving disc card method
  • CT (Computed Tomography) spatial resolution measurement method for improving disc card method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0060] Embodiments of the present invention are described below through specific examples, and those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific implementation modes, and various modifications or changes can be made to the details in this specification based on different viewpoints and applications without departing from the spirit of the present invention. It should be noted that the diagrams provided in the following embodiments are only schematically illustrating the basic concept of the present invention, and the following embodiments and the features in the embodiments can be combined with each other in the case of no conflict. Wherein, the accompanying drawings are used for illustrative purposes only, and represent only schematic diagrams rather than physical diagrams, and should not ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a CT (Computed Tomography) spatial resolution measurement method for improving a disc card method and belongs to the technical field of processing of images. The method comprises the following steps: S1, installing and starting a CT detection device; S2, carrying out fan-beam ray scanning; S3, rebuilding a two-dimensional image of a disc card by using a fan-beam FBP algorithm according to the obtained projection data; S4, obtaining a denoised grayscale image by using an RTV algorithm; S5, calculating the rebuilt two-dimensional image and the denoised gray image by using the improved disc card method to obtain an average gray value of the edge of the disc card; and S6, calculating ERF and PSF curves to obtain an MTF curve and a CT spatial resolution of the disc card. When the CT spatial resolution measurement method is used for calculating the edge gray value of the disc card, the influence of noise and insufficient card disc production accuracy on calculation of the edge average gray value is reduced, so that a more accurate and reasonable result can be obtained when calculating spatial resolution of a CT system.

Description

technical field [0001] The invention belongs to the technical field of image processing, and relates to a CT (Computed Tomography) spatial resolution measuring method which improves the disc card method. Background technique [0002] Spatial resolution, also known as high-contrast resolution, is an important indicator to describe the CT system. The current test methods include the wire pair card method, the circular hole card method and the disc card method. Although the testing process of the line pair card method and the round hole card method is simple, it requires high production requirements. The disk card is easy to make, but the testing process is complicated, and the test results require complicated calculations. In the calculation process of the disc card method, due to the noise and the insufficient precision of the disc card, this has a great impact on the most important step in the test process, that is, the calculation of the average gray level, and the final r...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01N23/04G01N23/046
Inventor 曾理程武昌沈宽龚长城
Owner CHONGQING UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com