Infrared temperature measurement method and device for target object based on contour extraction

Abstract

The invention relates to the field of image analysis, in particular to an infrared temperature measurement method and device for a target object based on contour extraction. The method comprises the following steps of detecting the target object according to infrared temperature measurement equipment in order to obtain a temperature distribution dot matrix; carrying out image contour extraction toobtain at least two contours in the whole infrared image; selecting a certain pixel point in the whole infrared image, and determining the innermost-layer contour containing the pixel point accordingto the selected pixel point, wherein the innermost-layer contour is a target contour; and acquiring relevant temperature data of the infrared image in the target contour. The image contour extractionis carried out on the temperature distribution dot matrix in order to obtain the at least two contours, and the innermost-layer contour containing a certain pixel point is used as the target contour,so that the phenomenon that a part of useless pixel points are framed in the contour or a part of useful pixel points are placed outside the contour can be avoided, and the display precision of temperature distribution details in the infrared temperature measurement is improved.

Description

technical field [0001] The invention relates to the field of image analysis, in particular to an infrared temperature measurement method and device for an object based on outline extraction. Background technique [0002] With the application of infrared temperature measurement technology in the state assessment of power equipment, how to effectively improve the accuracy of assessment has become the focus of attention. In the infrared temperature measurement image, the temperature distribution information of the heating area has important reference value for the status evaluation of the power equipment. In the infrared spectrum, the more detailed information of the temperature distribution, the greater the reference value for the status evaluation. Therefore, how to When the temperature resolution is certain, it is the focus of infrared spectrum processing to include more detailed information on temperature distribution as much as possible in the image display process. [00...

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to provide an infrared temperature measurement method and device based on contour extraction to solve the problem that the existing contour division method cannot completely match the contour of the target object that needs to be concerned with the temperature measurement area, resulting in some useless pixels The pixels that are framed in the outline or part of the useful pixels are placed outside the outline, resulting in a large temperature detection error

[0005] In order to realize infrared temperature measurement, the existing contour division method cannot completely fit the contour of the temperature measurement area of ​​the target object, resulting in some useless pixels being framed in the contour or some useful pixels being placed outside the contour , resulting in a large temperature detection error problem

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